Results 131 to 140 of about 14,870,547 (146)
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ECS Transactions, 2012
For high speed switching of ReRAM, we must elucidate a dominant parameter to control switching speed for a reset process (t reset). Since t reset is not necessarily determined by only one parameter, we proposed a method to get reset parameters which are expected to be related to t reset, low ...
Takumi Moriyama +3 more
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For high speed switching of ReRAM, we must elucidate a dominant parameter to control switching speed for a reset process (t reset). Since t reset is not necessarily determined by only one parameter, we proposed a method to get reset parameters which are expected to be related to t reset, low ...
Takumi Moriyama +3 more
openaire +1 more source
Microelectronics Reliability, 2019
Abstract Experiments on total ionizing dose (TID) by cobalt-60 and single event effects (SEE) by pulsed laser and heavy ions were conducted on a 4 Mb commercial ReRAM from Fujitsu. The bit cell features two-transistor-two-resistor (2T2R) architecture and a TaOx-based ReRAM stack.
J.S. Bi +6 more
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Abstract Experiments on total ionizing dose (TID) by cobalt-60 and single event effects (SEE) by pulsed laser and heavy ions were conducted on a 4 Mb commercial ReRAM from Fujitsu. The bit cell features two-transistor-two-resistor (2T2R) architecture and a TaOx-based ReRAM stack.
J.S. Bi +6 more
openaire +1 more source
MRS Proceedings, 2014
ABSTRACTWe focused on the presence of water absorbed in the grain boundary of a polycrystalline transition metal oxide (TMO) film in an EL/poly-TMO/EL structure. The effect of supplying water to resistive random access memories (ReRAMs) of Pt/NiO/Pt structure on switching voltages and data retention characteristics was investigated.
Ryosuke Ogata +4 more
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ABSTRACTWe focused on the presence of water absorbed in the grain boundary of a polycrystalline transition metal oxide (TMO) film in an EL/poly-TMO/EL structure. The effect of supplying water to resistive random access memories (ReRAMs) of Pt/NiO/Pt structure on switching voltages and data retention characteristics was investigated.
Ryosuke Ogata +4 more
openaire +1 more source
Multi-scale modeling of resistive random access memories (ReRAM)
Modélisation multi-échelles des mémoires de type résistives (ReRAM) Un modèle de commutation de mémoires résistives (ReRAM) est présenté. Celui-ci est basé sur deux hypothèses : (1) la commutation résistive est causée par des changements qui se produisent dans la zone étroite (région active) du filament conducteur sous l'influence du ...openaire +1 more source
Extended Abstracts of the 2015 International Conference on Solid State Devices and Materials, 2015
K. Kinoshita +6 more
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K. Kinoshita +6 more
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Extended Abstracts of the 2013 International Conference on Solid State Devices and Materials, 2015
K. Shiraishi +10 more
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K. Shiraishi +10 more
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Plasma co-doping to reduce the forming voltage in resistive random access memory (ReRAM) devices
2023KOTY DEVI +5 more
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2012 12th IEEE International Conference on Nanotechnology (IEEE-NANO), 2012
Hisashi Shima, Hiro Akinaga
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Hisashi Shima, Hiro Akinaga
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