Results 171 to 180 of about 11,242 (219)
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IEEE Electron Device Letters, 2021
In this work, a new operation scheme is developed to improve the state stability of multi-level resistive random-access memory (RRAM) array. We found that the state instability after programming is mainly derived from the excessive oxygen vacancies generated by the abrupt SET process.
Yulin Feng +8 more
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In this work, a new operation scheme is developed to improve the state stability of multi-level resistive random-access memory (RRAM) array. We found that the state instability after programming is mainly derived from the excessive oxygen vacancies generated by the abrupt SET process.
Yulin Feng +8 more
openaire +2 more sources
physica status solidi (RRL) – Rapid Research Letters, 2019
Because conventional nonvolatile memory is limited by process technology and physical size, resistive random access memory (RRAM) gradually enters the field of view due to its simple structure, fast program/erase speed, low power consumption, and so on.
Hong Wang, Xiaobing Yan
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Because conventional nonvolatile memory is limited by process technology and physical size, resistive random access memory (RRAM) gradually enters the field of view due to its simple structure, fast program/erase speed, low power consumption, and so on.
Hong Wang, Xiaobing Yan
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Journal of Electroceramics, 2017
Emerging non-volatile memory technologies are promising due to their anticipated capacity benefits, non-volatility, and zero idle energy. One of the most promising candidates is resistive random access memory (RRAM) based on resistive switching (RS). This paper reviews the development of RS device technology including the fundamental physics, material ...
Chen HY +13 more
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Emerging non-volatile memory technologies are promising due to their anticipated capacity benefits, non-volatility, and zero idle energy. One of the most promising candidates is resistive random access memory (RRAM) based on resistive switching (RS). This paper reviews the development of RS device technology including the fundamental physics, material ...
Chen HY +13 more
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Invited talk: Resistive random access memory (RRAM): Materials and devices
2013 IEEE Workshop on Microelectronics and Electron Devices (WMED), 2013Summary form only given. Nanoscale resistive memories (RRAMs) have generated extensive interest recently as a promising candidate for future non-volatile memory applications. In this talk, I will briefly summarize the current status of RRAM research, from the switching mechanism, modeling, material choice, performance metrics, to prototype memory ...
W. Lu
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ACS Applied Materials & Interfaces, 2020
In oxide-based RRAMs using reactive electrodes such as Al, the properties of spontaneously formed interfacial layers are critical factors in determining the resistive switching (RS) performance and reliability. This interfacial layer can provide the beneficial function of oxygen reservoir and series resistance, but is very labile and prone to ...
Chul Jin Park +2 more
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In oxide-based RRAMs using reactive electrodes such as Al, the properties of spontaneously formed interfacial layers are critical factors in determining the resistive switching (RS) performance and reliability. This interfacial layer can provide the beneficial function of oxygen reservoir and series resistance, but is very labile and prone to ...
Chul Jin Park +2 more
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Multi-Level Operation of Fully CMOS Compatible WOX Resistive Random Access Memory (RRAM)
2009 IEEE International Memory Workshop, 2009The multi-level operation of WO x based RRAM has been investigated. Improvement of our WO x process has produced an extended linear R-V region for our devices. By adding an electrical forming process and a program-verify algorithm we have demonstrated stable 2-bit/cell operation, with potential for 3-bit/cell.
W. C. Chien +12 more
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Resistive Random Access Memory (RRAM)
Shimeng Yu
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Metal oxide resistive random access memory (RRAM) technology
2014G. Bersuker, D.C. Gilmer
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Switching in polymeric resistance random-access memories (RRAMS)
Organic Electronics, 2008Resistive switching in aluminum-polymer-based diodes has been investigated using small signal impedance measurements. It is shown that switching is a two-step process. In the first step, the device remains highly resistive but the low frequency capacitance increases by orders of magnitude. In the second step, resistive switching takes place.
Gomes, Henrique L. +6 more
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