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beta-Mg17Al12, eta-Al8Mn5 and an alpha-magnesium phase have been synthesized from pure components by controlled solidification procedures.
Dominique Thierry +2 more
exaly +3 more sources
Scanning Kelvin Probe and Surface Photovoltage Analysis of Multicrystalline Silicon
Scanning Kelvin Probe (SKP) and Surface Photovoltage (SPV) methods have been implemented on the same stage in order to get information on surface, as well as on bulk, electronic properties of multi-crystalline Si wafers. The two probes allow for the measurements of three different parameters: the diffusion length, the majority carrier distribution and ...
Daniela Cavalcoli +2 more
exaly +4 more sources
Multitip scanning bio-Kelvin probe
We have developed a novel multitip scanning Kelvin probe which can measure changes in biological surface potential ΔVs to within 2 mV and, quasisimultaneously monitor displacement to <1 μm. The control and measurement subcomponents are PC based and incorporate a flexible user interface permitting software control of each individual tip ...
Baikie, I.D. +3 more
openaire +3 more sources
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Electrochimica Acta, 2007
With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences.
Michael Rohwerder
exaly +3 more sources
With the introduction of a Kelvin probe mode to atomic force microscopy, the so called scanning Kelvin probe force microscopy (SKPFM), the Kelvin probe technique finds application in a steadily increasing number of different fields, from corrosion science to microelectronics and biosciences.
Michael Rohwerder
exaly +3 more sources
Latent Fingermark Visualisation Using a Scanning Kelvin Probe
Forensic Science International, 2007The current state of the art in fingermark visualisation on metallic surfaces by a scanning Kelvin probe (SKP) technique is described. Latent eccrine fingermarks deposited on a range of polished and roughened metallic surfaces can be effectively imaged.
Hamilton McMurray
exaly +5 more sources
Scanning Kelvin Probe Microscopy on Bulk Heterojunction Polymer Blends
Advanced Functional Materials, 2009AbstractHere, correlated AFM and scanning Kelvin probe microscopy measurements with sub‐100 nm resolution on the phase‐separated active layer of polymer‐fullerene (MDMO‐PPV:PCBM) bulk heterojunction solar cells in the dark and under illumination are described.
René Janssen +2 more
exaly +3 more sources
Monitoring of Coating Disbondment by a Scanning Kelvin Probe Technique
The coating disbondment and corrosion of a X65 pipeline steel under coating were studied by scanning Kelvin probe (SKP) measurements. The effects of immersion time and wet-dry cycle on the Kelvin potential profile and the corrosion behavior of the steel were investigated.
A. Q. Fu, Y. F. Cheng
openaire +2 more sources

