Results 241 to 250 of about 1,540,265 (278)
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Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy
2004In 1981, Gerd Binning and Heinrich Rohree at IBM Zurich developed the first generation of the scanning probe microscope, the scanning tunneling microscope for which they received the Noble Prize in physics. The Scanning Tunneling Microscope (STM) was a fantastic breakthrough with its capability to image atoms with angstrom precision.
C. Druffner +4 more
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Journal of Applied Physics, 2002
The ability of a scanning Kelvin probe (SKP) to resolve lateral differences in specimen surface potential is investigated by two routes. First, electrostatic calculations are used to obtain analytical expressions for the maximum lateral resolution attainable by a “point probe” of negligible physical dimensions, as a function of probe–specimen distance.
Geraint Williams, Hamilton McMurray
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The ability of a scanning Kelvin probe (SKP) to resolve lateral differences in specimen surface potential is investigated by two routes. First, electrostatic calculations are used to obtain analytical expressions for the maximum lateral resolution attainable by a “point probe” of negligible physical dimensions, as a function of probe–specimen distance.
Geraint Williams, Hamilton McMurray
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ACS Nano, 2014
Abstract We study surface photovoltage decays on sub-millisecond time scales in organic solar cells using intensity-modulated scanning Kelvin probe microscopy (SKPM). Using polymer/fullerene (poly[N-9″-heptadecanyl-2,7-carbazole-alt-5,5-(4′,7′-di-2-thienyl-2′,1′,3′-benzothiadiazole)]/[6,6]-phenyl C71-butyric acid methyl ester, PCDTBT ...
Guozheng, Shao +4 more
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Abstract We study surface photovoltage decays on sub-millisecond time scales in organic solar cells using intensity-modulated scanning Kelvin probe microscopy (SKPM). Using polymer/fullerene (poly[N-9″-heptadecanyl-2,7-carbazole-alt-5,5-(4′,7′-di-2-thienyl-2′,1′,3′-benzothiadiazole)]/[6,6]-phenyl C71-butyric acid methyl ester, PCDTBT ...
Guozheng, Shao +4 more
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Analytical Chemistry, 2011
The integration of a scanning Kelvin probe (SKP) and a scanning electrochemical microscope (SECM) into a single SKP-SECM setup, the concept of the proposed system, its technical realization, and first applications are presented and discussed in detail.
Maljusch, A. +5 more
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The integration of a scanning Kelvin probe (SKP) and a scanning electrochemical microscope (SECM) into a single SKP-SECM setup, the concept of the proposed system, its technical realization, and first applications are presented and discussed in detail.
Maljusch, A. +5 more
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Scanning Kelvin probe study of metal/polymer interfaces
Electrochimica Acta, 2004Abstract A scanning Kelvin probe was used to study the metal/polymer contacts for models of epoxy, alkyd and polyaniline coatings. It was shown that the potential drop across the electrical double layer of oriented ionic dipoles at the metal/polymer interface contributes a major part of the measured Volta potentials.
A.P. Nazarov, D. Thierry
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Scanning Kelvin Probe to Study the Atmospheric Corrosion of Metals
ECS Meeting Abstracts, 2007Abstract not Available.
Dominique Thierry, Andrej Nazarov
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Application of Scanning Kelvin Probe for Monitoring Atmospheric Corrosion
ECS Meeting Abstracts, 2006Abstract not Available.
Teruhisa Tatsuoka +2 more
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Characterization of interfacial bonding using a scanning Kelvin probe
Journal of Applied Physics, 2004Interfaces play a crucial role in determining the ultimate properties and service life of coating and film materials. However, the characterization and measurement of interfacial bonding, in particular of the local strength, is difficult. The high sensitivity of the electron work function (EWF) to surface conditions has attracted increasing interest in
W. Li, D. Y. Li
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Low cost PC based scanning Kelvin probe
Review of Scientific Instruments, 1998We have developed a novel, low cost, scanning Kelvin probe (SKP) system that can measure work function (wf) and surface potential (sp) topographies to within 1 meV energy resolution. The control and measurement subcomponents are PC based and incorporate a flexible user interface, permitting software control of major parameters and allowing easy user ...
I. D. Baikie, P. J. Estrup
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Scanning kelvin probe analysis of welded stainless steel
Corrosion Science, 1997Abstract Welded type 316L stainless steel parts with different surface finish and passivation treatment have been evaluated by Scanning Kelvin Probe Analysis (SKPA). The stainless samples were cut from welded pipes of 2″ diameter. One set of samples had been electropolished, while the other set had been mechanically polished.
L.T. Han, F. Mansfeld
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