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A Scanning Kelvin Probe Analysis of Aluminum and Aluminum Alloys
CORROSION 1999, 1999Abstract A scanning Kelvin probe was used to determine a correlation between work function measurements in air and corrosion potential measurements in solution of pure metals. Test panels of AA2024-T3 treated with various surface preparations and primer/coatings were also analyzed using this technique.
Douglas C. Hansen +2 more
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Practical aspects of single-pass scan Kelvin probe force microscopy
Review of Scientific Instruments, 2012The single-pass scan Kelvin probe force microscopy (KPFM) in ambient condition has a few advantages over the dual-pass lift-up scan KPFM. For example, its spatial resolution is expected to be higher; and its topographical errors caused by electrostatic forces are minimized because electrostatic forces are actively suppressed during the simultaneous ...
Guangyong, Li +3 more
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Scanning Kelvin Probe Study of (Oxyhydr)oxide Surface of Aluminum Alloy
The Journal of Physical Chemistry C, 2012In this paper, the work function, referenced as electrode potential vs SHE, of modified (oxyhydr)oxide surfaces of AA1050 was studied upon exposure to different relative humidity (40% and 90%) and aging (40 and 240 min) by utilizing scanning Kelvin probe (SKP). Besides reference samples, different pretreatments (acid, alkaline, and immersion in boiling
Ozkanat, O. +5 more
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UHV-compatible spectroscopic scanning Kelvin probe for surface analysis
Surface Science, 1999Abstract We have developed an ultra-high vacuum (UHV) compatible scanning Kelvin probe (SKP) to measure local work function ( φ ) differences between a conducting sample and a reference metal tip to less than 1 meV. The work function is an extremely sensitive indicator of surface condition and is affected by adsorption, evaporation, surface ...
I. Baikie, U. Petermann, B. Lägel
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Application of Scanning Kelvin Probe in Corrosion Science
2005Rohwerder, M. +3 more
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Scanning Kelvin Probe Force Microscopy
Journal of The Electrochemical Society, 2004D. Bengtsson Blücher +4 more
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Study of semiconductor and metal surfaces using a novel scanning Kelvin probe
2000This thesis reports design and construction of a novel Scanning Kelvin probe (SKP) compatible with the Ultra-High-Vacuum (UHV) environment - the first automatic, high resolution, UHV-SKP in the UK. The Kelvin Probe is a capacitor device used to measure the work function phi between a vibrating reference electrode (the tip) and the surface under ...
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Development and application of the scanning Kelvin probe for solar cell defect analysis
2006The Kelvin probe is a non-contact, non invasive capacitor device capable of detecting changes in local work function and surface state and has become a valuable tool for surface science research. This thesis presents three years of work centred on the development and novel applications of the scanning Kelvin probe (SKP) technique.
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