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Real versus Measured Surface Potentials in Scanning Kelvin Probe Microscopy
ACS Nano, 2008 Noncontact potentiometry or scanning Kelvin probe microscopy (SKPM) is a widely used technique to study charge injection and transport in (in)organic devices by measuring a laterally resolved local potential. This technique suffers from the significant drawback that experimentally obtained curves do not generally reflect the true potential profile in ...
Charrier, D.S.H. +4 more
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ACS Nano, 2013 Using environmental scanning Kelvin probe microscopy we show that the position of the Fermi level of single layer graphene is more sensitive to chemical gating than that of double layer graphene.
Jens Eriksson +2 more
exaly +2 more sources
Scanning Kelvin Probe Microscopy Investigation of the Role of Minority Carriers on the Switching Characteristics of Organic Field-Effect Transistors [PDF]
Advanced Materials, 2016 We have developed a Scanning Kelvin Probe Microscopy (SKPM) based method to probe the effects of low-mobility minority carriers on the switching characteristics of organic field effect transistors (OFETs).
Yuanyuan Hu +2 more
exaly +3 more sources
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Calibration of the Scanning Kelvin Probe By Applied External Potential
ECS Meeting Abstracts, 2022The scanning Kelvin probe (SKP) is a device that measures the difference in work function between a sample and probe tip on the instrument, and has proven to be a useful research tool over the past several decades. With this technique, the Volta potential difference, also known as the contact potential difference (CPD), can be determined which can ...
Ronald Anthony Zeszut, Douglas C Hansen
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Localized charge imaging with scanning Kelvin probe microscopy
Nanotechnology, 2016Abstract In this work, we propose an intuitive and easily implementable approach to model and interpret scanning Kelvin probe microscopy images of insulating samples with localized charges. The method, based on the image charges method, has been validated by a systematic comparison of its predictions with experimental measurements ...
M F, Orihuela +4 more
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Enrichment of Alloying Elements in Aluminum: A Scanning Kelvin Probe Approach
Journal of The Electrochemical Society, 2012A scanning Kelvin probe technique is used to study the influences of the enriched alloy layers on the corrosion behavior of surface-treated, sputtering-deposited Al-0.7 at .%Cu and Al-1.0 at .%Au alloys. The alloys were etched in sodium hydroxide solution to produce the enriched layers of copper and gold respectively at the alloy/oxide interface. Volta
Garcia-Vergara, S. J. +4 more
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Space Charge Measurements with the Scanning Kelvin Probe
IEEE Transactions on Dielectrics and Electrical Insulation, 2008Using the scanning Kelvin probe the potential distribution on the surface of an ion- conducting polymer (polyethylene oxide) can be determined. Due to space charge accumulations a voltage applied between two electrodes causes a strongly nonlinear potential distribution in the samples.
Bjoern Martin, Herbert Kliem
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Surface investigation by using a Scanning Kelvin Probe
2010 International Students and Young Scientists Workshop "Photonics and Microsystems", 2010In this paper we present the relative work function measurements of Platinum (Pt), Molybdenum (Mo), Lead (Pb), and Graphite (C) by using Kelvin Probe. The obtained results have shown that the work function measurements made in air are affected by the adsorption of oxygen.
G Halek, I D Baikie, H Teterycz
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Lateral resolution in scanning Kelvin probe microscopy
Corrosion Science, 2016Abstract The lateral resolution of a scanning Kelvin probe (SKP) is a key parameter for investigating microstructures. It depends on two main device parameters, the tip diameter and the tip sample distance. Variation of them affects physical parameters like stray capacitance and signal intensity.
Mariusz Wicinski +2 more
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