Results 21 to 30 of about 10,859 (269)

A Stable and Efficient Pt/n-Type Ge Schottky Contact That Uses Low-Cost Carbon Paste Interlayers

open access: yesCrystals, 2021
Ge-based Schottky diodes find applications in high-speed devices. However, Fermi-level pinning is a major issue for the development of Ge-based diodes. This study fabricates a Pt/carbon paste (CP)/Ge Schottky diode using low-cost CP as an interlayer. The
Pei-Te Lin   +8 more
doaj   +1 more source

Integration of Silicon-Carbide Schottky Diodes with High-Frequency Transformer [PDF]

open access: yes, 2022
This paper presents a novel and compact structure of integrated silicon-carbide (SiC) Schottky diodes with highfrequency (HF) transformer. A prototype HF transformer in the shape that is similar to a tokamak is designed for the integration with SiC ...
Yao, Weichong   +5 more
core  

A Compact Model for SiC Schottky Barrier Diodes Based on the Fundamental Current Mechanisms [PDF]

open access: yes, 2020
We develop a complete compact model to describe the forward current, reverse current, and capacitance of SiC Schottky barrier diodes. The model is based on the fundamental current mechanisms of thermionic emission and tunneling, and is usable over a ...
Dimitrijev, Sima, Nicholls, Jordan R
core   +1 more source

Fabrication, Characterization and Simulation of Sputtered Pt/In-Ga-Zn-O Schottky Diodes for Low-Frequency Half-Wave Rectifier Circuits

open access: yesIEEE Access, 2020
Amorphous In-Ga-Zn-O (IGZO) is a high-mobility semiconductor employed in modern thin-film transistors for displays and it is considered as a promising material for Schottky diode-based rectifiers.
Veronika Ulianova   +11 more
doaj   +1 more source

Description and Verification of the Fundamental Current Mechanisms in Silicon Carbide Schottky Barrier Diodes [PDF]

open access: yes, 2019
Attempts to model the current through Schottky barrier diodes using the two fundamental mechanisms of thermionic emission and tunnelling are adversely impacted by defects and second order effects.
Nicholls, Jordan   +3 more
core   +1 more source

Enhanced Non-Uniformity Modeling of 4H-SiC Schottky Diode Characteristics Over Wide High Temperature and Forward Bias Ranges

open access: yesIEEE Journal of the Electron Devices Society, 2020
A practical model, adequate for full reproduction of inhomogeneous Schottky diodes' forward characteristics over wide high-temperature and bias ranges, is proposed.
Gheorghe Brezeanu   +5 more
doaj   +1 more source

Oxidized metal Schottky contact with high-κ dielectric field plate for low-loss high-power vertical β-Ga2O3 Schottky diodes

open access: yesAPL Materials, 2022
We report on vertical β-Ga2O3 power diodes with oxidized-metal Schottky contact (PtOx) and high permittivity (high-κ) dielectric (ZrO2) field plate to improve reverse blocking at both Schottky contact surfaces and edges.
Esmat Farzana   +5 more
doaj   +1 more source

Simulation of forward current-voltage characteristics for Schottky diodes with MOS trenches

open access: yesДоклады Белорусского государственного университета информатики и радиоэлектроники, 2021
Present work is devoted to the development of a mathematical model for the forward current-voltage characteristic of Schottky diodes with a metal – oxide – semiconductor (MOS) trench structure, which takes into account the accumulation of the main ...
J. A. Solovjov
doaj   +1 more source

Current Transport Behaviour of Au/n-GaAs Schottky Diodes Grown on Ge Substrate With Different Epitaxial Layer Thickness Over a Wide Temperature Range [PDF]

open access: yesЖурнал нано- та електронної фізики, 2011
The work presents temperature dependent forward and reverse current-voltage (I-V) analyses of n-GaAs/Au Schottky Diodes grown on n+ Ge substrate with different epitaxial layer thicknesses.
N. Padha   +3 more
doaj  

Effect of Series Resistance and Interface State Density on Electrical Characteristics of Au/SiO2/n-GaN Schottky Diodes [PDF]

open access: yesЖурнал нано- та електронної фізики, 2011
We have investigated the current-voltage (I−V) characteristics of (Au/SiO2/n-GaN) metal-insulator-semiconductor (MIS) Schottky diodes and compared with (Au/n-GaN) metal-semiconductor (MS) Schottky diode. The effect of SiO2 on the surface preparation of n-
M. Siva Pratap Reddy   +3 more
doaj  

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