Results 61 to 70 of about 11,186 (164)
Nanoimprint—Mo(o)re than Lithography
Nanoimprint lithography (NIL) is a high-resolution parallel patterning method based on molding. It has proven resolution down to the nanometer range and can be scaled up for large areas and high throughput.
Helmut Schift
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Heterodyne polarimetry technology for inspection of critical dimensions
Heterodyne polarimetry is based on the analysis of phases and polarization states of two frequency shifted cross-polarized waves, generated by Zeeman lasers and their analogs [1]. In semiconductor industry, manufacturing of memory chips depends on the
Protopopov V.
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Semiconductor lasers are the most efficient devices for light generation. The Photonic Crystal Surface Emitting Laser (PCSEL) is a type of semiconductor laser that uses a 2D photonic crystal (PC) structure acting as the lateral cavity.
Sammeta Poojitha +10 more
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Electron beam lithography (EBL) and extreme ultraviolet lithography (EUVL) have been continuously improved and applied in semiconductor and biomedical device manufacturing. With the development of biomedical nanodevices, the demand for biodegradable, and
Yurui Wu +14 more
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A Sub-Pixel Measurement Platform Using Twist-Angle Analysis in Two-Dimensional Planes
Arrayed ultraviolet (UV) LED light sources have been widely applied in various semiconductor processes, ranging from photopolymerization to lithography.
Jiangbo Lyu +4 more
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Solution-Processed Submicron-Channel Organic Ferroelectric Memristors with a Low Operation Voltage of 1 V. [PDF]
Xu K +6 more
europepmc +1 more source
The Evolution of Lithography: From Resolution Scaling to Manufacturing Constraints. [PDF]
Chae H, Park H, Kang DJ.
europepmc +1 more source
Nitrogen-Vacancy Centers in Fluorescent Nanodiamonds: Emerging Applications from Healthcare Diagnostics to Semiconductor Metrology. [PDF]
Chang HC.
europepmc +1 more source
Stitch-Less Lithography Empowered by Multi-Dimensional Holography. [PDF]
Huang HH +5 more
europepmc +1 more source
Recent efforts of vapour-phase strategies for EUV resist toward high- and hyper-NA extreme ultraviolet lithography. [PDF]
Chu TTH +13 more
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