Results 201 to 210 of about 21,181 (269)

Dynamic Performance Evaluation of Bidirectional Bridgeless Interleaved Totem-Pole Power Factor Correction Boost Converter. [PDF]

Micromachines (Basel)
Cheng HC, Jhu WY, Liu YC, Zheng DW, Liu YC, Chang TC.   +5 more
europepmc   +1 more source

Structurally optimized SiC CMOS FinFET for high-temperature and low-power SoC logic integration. [PDF]

Sci Rep
Kwon TS, Yoon YJ, Park DY, Bae JH, Song YS, Kim HW, Seo JH, Woo SY.   +7 more
europepmc   +1 more source

Novel 4H-SiC Double-Trench MOSFETs with Integrated Schottky Barrier and MOS-Channel Diodes for Enhanced Breakdown Voltage and Switching Characteristics. [PDF]

Nanomaterials (Basel)
Wang P, Li C, Deng C, Yang Q, Xu S, Tang X, Wang Z, Tao W, Tao N, Wang Q, Yu H.   +10 more
europepmc   +1 more source

Sensorless Junction Temperature Estimation of Onboard SiC MOSFETs Using Dual-Gate-Bias-Triggered Third-Quadrant Characteristics. [PDF]

Sensors (Basel)
Lu Y, Ding Y, Li J, Yin H, Li X, Zhu C, Zhang X.   +6 more
europepmc   +1 more source

Performance evaluation of a bi-directional synchronous H6 inverter for AC/DC system interaction with SiC and Si-Based at different switching frequencies. [PDF]

PLoS One
Alshammari MS, Namadmalan A, Duffy M.
europepmc   +1 more source

A 3.3 kV SiC Semi-Superjunction MOSFET with Trench Sidewall Implantations. [PDF]

Micromachines (Basel)
Boccarossa M, Melnyk K, Renz AB, Gammon PM, Kotagama V, Shah VA, Maresca L, Irace A, Antoniou M.   +8 more
europepmc   +1 more source

SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation. [PDF]

Micromachines (Basel)
Metreveli A, Hallén A, Zetterling CM.
europepmc   +1 more source

Isolation of Cumulative Heavy-Ion Induced Trench Degradation Effects within a Commercial 4H-SiC Double Trench MOSFET

Virendra Kotagama, Arne Benjamin Renz, Kyrylo Melnyk, Zhao Xue Yuan, Valeria Kilchytska, Denis Flandre, Vishal A. Shah, Marina Antoniou, Peter Michael Gammon   +8 more
openalex   +1 more source

Physics and applications of Si-based nanoelectromechanical information devices (Plenary Talk)

, 2007
Mizuta, Hiroshi, Oda, S., Tsuchiya, Yoshishige   +2 more
core  

Nondestructive detection and identification of electrically active threading dislocations in n⁺-SiC substrates. [PDF]

Nanoscale Adv
Kurniawan IS, Sevilla RC, Hsu HM, Soebroto RJ, Wu CB, Shen JL, Huang HY, Li WC, Yuan CT.   +8 more
europepmc   +1 more source