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Active Switching with SiC MOSFETs

2019 IEEE Energy Conversion Congress and Exposition (ECCE), 2019
The work in this paper presents a methodology to overcome the coupled nature of dv/dt and di/dt to gate drive resistance and stray commutation inductance for a SiC MOSFET. The SiC MOSFET exhibits almost ideal switching behavior, corresponding closely to the simplified device equations.
Patrick Palmer   +2 more
openaire   +1 more source

Trench-MOSFETs on 4H-SiC

Materials Science Forum, 2016
This paper introduces n-channel normally-off Trench-MOSFETs on 4H-SiC featuring a blocking voltage of 600 V and 1200 V. The Trench-MOSFETs exhibit a specific room temperature on-state resistance RDS,on of 1.5 mΩ cm² and 2.7 mΩ cm², respectively. It is shown that a further reduction of the RDS,on by approximately 25 % can be achieved using square-shaped
Christian T. Banzhaf   +4 more
openaire   +1 more source

On the subthreshold measurements of SIC MOSFETs

2008 IEEE International Conference on Semiconductor Electronics, 2008
Reported here are subthreshold measurements on n-channel 6H-SiC MOSFETs over a range of temperatures. A simple theoretical model is presented to explain their general form. It is shown that the temperature dependence of the subthreshold current indicates a high density of electronic states at or near the SiC-SiO2 interface.
openaire   +1 more source

Fabrication and evaluation of SiC inverter using SiC-MOSFET

2013 IEEE 10th International Conference on Power Electronics and Drive Systems (PEDS), 2013
This paper deals with device characteristics of SiC-MOSFET (600 V, 10 A) and efficiency characteristics of SiC inverter when the motor is driven as compared respectively with Si-MOSFET and Si inverter. As a result, it was found that on-resistance of SiC-MOSFET is smaller than that of Si-MOSFET, and switching loss of SiC-MOSEFET is approximately 1/3 ...
A. Yamane   +4 more
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Comparison of 3C-SiC and 4H-SiC Power MOSFETs

Materials Science Forum, 2018
A comprehensive comparison of 3C-SiC and 4H-SiC power MOSFETs was performed, aimed at quantifying and comparing the devices’ on-resistance and switching loss. To this end, the relevant material parameters were collected using experimental data where available, or those obtained by simulation.
Bart J. Van Zeghbroeck, Hamid Fardi
openaire   +1 more source

Dynamic On-State Resistance in SiC MOSFETs

2023 IEEE International Reliability Physics Symposium (IRPS), 2023
Ronald Green   +4 more
openaire   +1 more source

Reliability studies of SiC vertical power MOSFETs

2018 IEEE International Reliability Physics Symposium (IRPS), 2018
Power metal-oxide-semiconductor field-effect transistors (MOSFETs) experience conditions of high field during normal operation, with high MOS gate oxide field in the on-state, and high drift and termination fields in the blocking state. Moreover, silicon carbide devices typically experience higher fields than comparable Si devices due to channel and ...
Daniel J. Lichtenwalner   +9 more
openaire   +1 more source

A non-segmented PSpice model of SiC MOSFETs

IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, 2017
To solve the simulation convergence problem of Silicon Carbide metal-oxide semiconductor field effect transistor (SiC MOSFET) models, this paper proposes a non-segmented model for SiC MOSFETs, which uses non-segmented, smooth continuous equations to describe the static and dynamic characteristics of SiC MOSFET. Further, the static characteristic of SiC
Hong Li 0002   +3 more
openaire   +1 more source

Thermal instability effects in SiC Power MOSFETs

Microelectronics Reliability, 2012
Abstract Silicon carbide (SiC) power MOSFETs are characterised by potentially thermally unstable behaviour over a broad range of bias conditions. In the past, such behaviour has been shown for silicon (Si) MOSFETs to be related to a reduction of Safe Operating Area at higher drain–source bias voltages.
Alberto Castellazzi   +3 more
openaire   +1 more source

Developments of SiC DioMOS (Diode Integrated SiC MOSFET)

MRS Proceedings, 2014
ABSTRACTSiC power devices can handle large power and high frequency switching beyond the Si power devices. Typical full-SiC power modules are composed of both SiC-MOSFETs and SiC-SBDs to suppress the degradation of Ron of SiC-MOSFET during the bipolar reverse-current flow while there will be unfavorable consequences such as increased material cost ...
openaire   +1 more source

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