Results 161 to 170 of about 21,181 (269)

Investigation on Gate Capacitance Peak in SiC MOSFETs With Biased Drain

open access: hybrid
Ilaria Matacena   +3 more
openalex   +1 more source

Enhanced Gate Oxide Reliability in Vertical SiC Power MOSFETs via Optimized Processing and Screening [PDF]

open access: hybrid
Ayan K. Biswas   +8 more
openalex   +1 more source

Characterization of 4H-SiC Lateral MOSFETs up to 773 K

open access: hybrid
Nicola Rinaldi   +7 more
openalex   +1 more source

A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability. [PDF]

open access: yesMaterials (Basel)
Feng Z   +7 more
europepmc   +1 more source

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