Results 211 to 220 of about 21,181 (269)

Test Methodology for Short-Circuit Assessment and Safe Operation Identification for Power SiC MOSFETs

open access: gold
Joao Oliveira   +8 more
openalex   +1 more source

Extremely Low Thermal Resistance of β-Ga2O3 MOSFETs by Co-integrated Design of Substrate Engineering and Device Packaging. [PDF]

open access: yesACS Appl Mater Interfaces
Qu Z   +10 more
europepmc   +1 more source

Recent Progress in SiC-MOSFET

open access: yesRecent Progress in SiC-MOSFET
openaire  

SiC MOSFETs

2020
Modern switching components for energy processing widely consist of active semiconductor devices in Si, a mature and well-established technology that is reaching its physical limits. The main limitations of Si concern the blocking voltage capability, the switching frequency, and the operating temperature.
Maresca L.   +7 more
openaire   +2 more sources

A simple SiC power MOSFET model

IECON 2017 - 43rd Annual Conference of the IEEE Industrial Electronics Society, 2017
With the application of SiC power metal-oxide-semiconductor field-effect transistor (MOSFET) in high voltage power converters, switching frequency and speed increase. Thus, severe electromagnetic interference(EMI) problems occur. To predict EMI performances and evaluate other performances in the design phase, a simple and valid switch model is needed ...
Zhuolin Duan   +3 more
openaire   +1 more source

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