Results 41 to 50 of about 779,893 (262)
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems.
T.S. Nidhin +4 more
doaj +1 more source
ABSTRACT Primary lung carcinomas and bronchial carcinoid tumors (BC) are very rare malignancies in childhood. While typical BC and mucoepidermoid carcinomas are mostly low‐grade, localized tumors with a more favorable prognosis than in adults, necessitating avoidance of overtreatment, adenocarcinomas of the lung are often diagnosed at advanced disease ...
Michael Abele +19 more
wiley +1 more source
This study investigates the single-event burnout (SEB) mechanisms of 800 V Vertical Double-Diffusion Metal-Oxide-Semiconductor (VDMOS) devices using the China Spallation Neutron Source (CSNS) Atmospheric Neutron Irradiation Spectrometer.
Xirui Zhou +6 more
doaj +1 more source
Efficient error rate estimation for single event effects considering statistical uncertainty
This study proposes the efficient error rate estimation method for Single Event Effects (SEE) considering statistical uncertainty. SEE is known to make significant damage to a semiconductor device used for a spacecraft on orbit by exposed to cosmic rays ...
Kisumi IIDA, Nozomu KOGISO
doaj +1 more source
Results of the Childhood Cancer and Leukaemia Group's United Kingdom Relapsed Wilms Tumour Trial
ABSTRACT Background The United Kingdom relapsed Wilms tumour (UKW‐R) trial aimed to improve the historically low survival rates after relapse of Wilms tumour (WT) through a prospective national risk‐stratified protocol. The trial also evaluated efficacy and toxicity of high‐dose melphalan.
Sucheta J. Vaidya +10 more
wiley +1 more source
Lateral 1200V SiC schottky barrier diode with single event burnout tolerance
For a power device to be used in space, it must be able to recover from a single event effect caused by heavy ion radiation. Conventional vertical silicon carbide (SiC) power devices such as automotive diodes and MOSFETs, can only meet this requirement ...
Yunyi Qi +5 more
doaj +1 more source
Failure Estimates for SiC Power MOSFETs in Space Electronics
Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs) are space-ready in terms of typical reliability measures. However, single event burnout (SEB) due to heavy-ion irradiation often occurs at voltages 50% or lower than
Kenneth F. Galloway +8 more
doaj +1 more source
ABSTRACT Introduction Adolescent siblings of children with cancer are at elevated risk for psychosocial problems. Unfortunately, various barriers such as limited family time and resources, conflicting schedules, and psychosocial staffing constraints at cancer centers hinder sibling access to support.
Christina M. Amaro +10 more
wiley +1 more source
Single event effects radiation testing requirements: a minimax approach
One of the key challenges of single-event effects (SEE) testing of integrated circuits (ICs) and semiconductor devices is determining the "test requirements". This refers to the level of exposure at the test facility that allows for conclusions about the
Armen V. Sogoyan +5 more
doaj +1 more source
The paper analyzes the applicability of methods for estimating the parameters of the VLSI sensitivity by single radiation effects (SEE) using focused laser radiation of picosecond duration in order to expand their application for submicron VLSI.
Alexander I. Chumakov
doaj +1 more source

