Results 51 to 60 of about 18,097,747 (302)

Venetoclax‐Based Therapy as a Bridge to Hematopoietic Stem Cell Transplantation in Relapsed or Refractory Pediatric Acute Leukemia

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Relapsed and/or refractory (R/R) pediatric acute leukemia carries a dismal prognosis, largely driven by chemoresistance to conventional salvage therapy. The BH3‐mimetic venetoclax, combined with chemotherapy or hypomethylating agents, has demonstrated efficacy in small clinical trials.
Katherine S. Colman, Deborah Meyran, Vajiranee Malalasekera, Heather Weerdenburg, Janine Campbell, Rachel Conyers, Stacie Wang, Hannah Walker, Seong Lin Khaw, Diane Hanna   +9 more
wiley   +1 more source

Test report for single event effects of the 80386DX microprocessor [PDF]

, 1993
The Jet Propulsion Laboratory Section 514 Single Event Effects (SEE) Testing and Analysis Group has performed a series of SEE tests of certain strategic registers of Intel's 80386DX CHMOS 4 microprocessor.
Nichols, Donald K., Watson, R. Kevin, Schwartz, Harvey R.   +2 more
core  

Language, Culture, and Cancer: Qualitative Insights Into Communication Disparities Among Spanish‐Speaking Caregivers of Children With Cancer

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Latino children are projected to make up nearly one‐third of United States (US) children by 2060, and many of their caregivers speak Spanish. Prior survey research has documented communication difficulties for Spanish‐speaking caregivers of children with cancer, but contemporary qualitative data are limited.
Jenny Ruiz, Alejandra Curbelo‐Paz, Sonia Morales, Elizabeth Contreras, Amy Houtrow, Scott H. Maurer, Judy C. Chang   +6 more
wiley   +1 more source

Atmospheric neutron single-event burnout in Vertical Double-diffused Metal-Oxide-Semiconductor (VDMOS) devices

Nuclear Engineering and Technology
This study investigates the single-event burnout (SEB) mechanisms of 800 V Vertical Double-Diffusion Metal-Oxide-Semiconductor (VDMOS) devices using the China Spallation Neutron Source (CSNS) Atmospheric Neutron Irradiation Spectrometer.
Xirui Zhou, Yuanyuan Zhang, Pei Li, Hao Yu, Chaohui He, Yuwei Guo, Haojie Bai   +6 more
doaj   +1 more source

Failure Estimates for SiC Power MOSFETs in Space Electronics

Aerospace, 2018
Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs) are space-ready in terms of typical reliability measures. However, single event burnout (SEB) due to heavy-ion irradiation often occurs at voltages 50% or lower than
Kenneth F. Galloway, Arthur F. Witulski, Ronald D. Schrimpf, Andrew L. Sternberg, Dennis R. Ball, Arto Javanainen, Robert A. Reed, Brian D. Sierawski, Jean-Marie Lauenstein   +8 more
doaj   +1 more source

Biphasic Clinical Course of Pediatric Cytomegalovirus‐Associated Immune Thrombocytopenia: Early Poor Treatment Response but Favorable Long‐Term Outcomes

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background Cytomegalovirus (CMV) is a recognized trigger of immune thrombocytopenia (ITP); however, its incidence and impact on disease course in children remain controversial. Therefore, we aimed to characterize the clinical course of pediatric patients with CMV‐associated ITP.
Oded Gilad, Ohad Atia, Osama Tanous, Dafna Brik Simon, Michal Dvori, Miriam Cohen, Tracie A. Goldberg, Efraim Bilavsky, Joanne Yacobovich, Orna Steinberg‐Shemer   +9 more
wiley   +1 more source

Lateral 1200V SiC schottky barrier diode with single event burnout tolerance

Power Electronic Devices and Components
For a power device to be used in space, it must be able to recover from a single event effect caused by heavy ion radiation. Conventional vertical silicon carbide (SiC) power devices such as automotive diodes and MOSFETs, can only meet this requirement ...
Yunyi Qi, Peter Michael Gammon, Arne Benjamin Renz, Viren Kotagama, Guy William Clarke Baker, Marina Antoniou   +5 more
doaj   +1 more source

Efficient error rate estimation for single event effects considering statistical uncertainty

Nihon Kikai Gakkai ronbunshu, 2019
This study proposes the efficient error rate estimation method for Single Event Effects (SEE) considering statistical uncertainty. SEE is known to make significant damage to a semiconductor device used for a spacecraft on orbit by exposed to cosmic rays ...
Kisumi IIDA, Nozomu KOGISO
doaj   +1 more source

Single event effects in 0.18μm CMOS image sensors [PDF]

SPIE Proceedings, 2016
CMOS image sensors are widely used on Earth and are becoming increasingly favourable for use in space. Advantages, such as low power consumption, and ever-improving imaging peformance make CMOS an attractive option. The ability to integrate camera functions on-chip, such as biasing and sequencing, simplifies designing with CMOS sensors and can improve ...
Rushton, Joseph E., Stefanov, Konstantin D., Holland, Andrew D., Bugnet, Henri, Mayer, Frederic, Cordrey-Gale, Matthew, Endicott, James   +6 more
openaire   +1 more source

Parents of Youth With Cancer Report on Their Psychosocial Care: iSTEPPP Survey Finds Alignment and Gaps With Standards

Pediatric Blood &Cancer, EarlyView.
ABSTRACT Background The Standards for Psychosocial Care for Children with Cancer and Their Families guide the provision of comprehensive psychosocial care. Parallel to research characterizing implementation of the Standards from the perspective of providers, this study examines implementation of the Standards from the perspective of parents of youth ...
Emily M. Pariseau, Kimberly Buff, Michele A. Scialla, Kimberly S. Canter, Lori Wiener, Victoria Sardi‐Brown, Julia B. Tager, Kamyar Arasteh, Anne E. Kazak   +8 more
wiley   +1 more source