Results 41 to 50 of about 811,254 (262)
Pediatric Blood &Cancer, EarlyView.ABSTRACT Background Acute lymphoblastic leukemia (ALL) is the most common pediatric cancer, with an overall survival now surpassing 90% in developed countries. However, treatments are not without adverse effects. In this study, we apply the severe toxicity‐free survival (STFS) framework to determine the prevalence of 21 physician‐defined severe ...
Lane Collier +10 more
wiley +1 more source
Nuclear Engineering and TechnologyThis study investigates the single-event burnout (SEB) mechanisms of 800 V Vertical Double-Diffusion Metal-Oxide-Semiconductor (VDMOS) devices using the China Spallation Neutron Source (CSNS) Atmospheric Neutron Irradiation Spectrometer.
Xirui Zhou +6 more
doaj +1 more source
Failure Estimates for SiC Power MOSFETs in Space Electronics
Aerospace, 2018 Silicon carbide (SiC) power metal-oxide-semiconductor field effect transistors (MOSFETs) are space-ready in terms of typical reliability measures. However, single event burnout (SEB) due to heavy-ion irradiation often occurs at voltages 50% or lower than
Kenneth F. Galloway +8 more
doaj +1 more source
Pediatric Blood &Cancer, EarlyView.ABSTRACT Background Type 1 plasminogen deficiency (PLGD‐1) is an ultra‐rare autosomal recessive disorder caused by variants in the PLG gene and affects approximately 1.6 individuals per million. The condition is characterized by decreased plasminogen levels and impaired function, resulting in fibrin‐rich lesions on mucous membranes throughout the body.
Charles Nakar +7 more
wiley +1 more source
Lateral 1200V SiC schottky barrier diode with single event burnout tolerance
Power Electronic Devices and ComponentsFor a power device to be used in space, it must be able to recover from a single event effect caused by heavy ion radiation. Conventional vertical silicon carbide (SiC) power devices such as automotive diodes and MOSFETs, can only meet this requirement ...
Yunyi Qi +5 more
doaj +1 more source
Efficient error rate estimation for single event effects considering statistical uncertainty
Nihon Kikai Gakkai ronbunshu, 2019 This study proposes the efficient error rate estimation method for Single Event Effects (SEE) considering statistical uncertainty. SEE is known to make significant damage to a semiconductor device used for a spacecraft on orbit by exposed to cosmic rays ...
Kisumi IIDA, Nozomu KOGISO
doaj +1 more source
Single event effects in 0.18μm CMOS image sensors [PDF]
SPIE Proceedings, 2016 CMOS image sensors are widely used on Earth and are becoming increasingly favourable for use in space. Advantages, such as low power consumption, and ever-improving imaging peformance make CMOS an attractive option. The ability to integrate camera functions on-chip, such as biasing and sequencing, simplifies designing with CMOS sensors and can improve ...
Rushton, Joseph E. +6 more
openaire +1 more source
Pediatric Blood &Cancer, EarlyView.ABSTRACT Introduction The use of herbal medical preparation (HMP) is rising among pediatric oncology patients, often to manage treatment‐related symptoms. Their effectiveness remains uncertain, and the risk of herb–drug interactions is underestimated.
Orianne Mahot +6 more
wiley +1 more source
Single event effects radiation testing requirements: a minimax approach
Безопасность информационных технологийOne of the key challenges of single-event effects (SEE) testing of integrated circuits (ICs) and semiconductor devices is determining the "test requirements". This refers to the level of exposure at the test facility that allows for conclusions about the
Armen V. Sogoyan +5 more
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Безопасность информационных технологий, 2019 The paper analyzes the applicability of methods for estimating the parameters of the VLSI sensitivity by single radiation effects (SEE) using focused laser radiation of picosecond duration in order to expand their application for submicron VLSI.
Alexander I. Chumakov
doaj +1 more source