Results 21 to 30 of about 18,097,747 (302)

Propagazione di single-event transients in logiche combinatorie [PDF]

, 2022
Lo scopo di questa trattazione è quello di studiare la propagazione dei SET (Single-Event Transients) in catene di inverter implementate a partire da porte logiche di tipo NOT NOR e NAND, tramite l’ausilio di un simulatore tridimensionale.
Bevilacqua, Andrea
core  

Single-Event Radiation Effects in Silicon Carbide Power MOSFETs

, 2021
In this research, the radiation induced single event effects (SEE) observed in silicon carbide (SiC) power MOSFETs have been studied. Heavy ions, terrestrial neutrons and protons were selected as radiation environments to be investigated, as ...
Martinella, Corinna
core   +1 more source

Hardness assurance levels and requirements for single event effects testing of integrated circuits

Безопасность информационных технологий, 2020
The paper presents an analysis of existing approaches to estimation of single event rate (SER) in integrated circuits under effects of charged particles of space radiation environment.
Alexander I. Chumakov, Armen V. Sogoyan, Anatoly A. Smolin, Alexey O. Ahmetov, Dmitry V. Bobrovsky, Dmitry V. Boychenko, Nikolai V. Ryasnoy, Konstantin A. Chumakov, Evgeny V. Churilin, Vladimir F. Gerasimov, Vitaly V. Khaustov, Alexander A. Sashov, Anastasia V. Ulanova, Andrey V. Yanenko   +13 more
doaj   +1 more source

Single Event Effects Rate Calculation with Different Models

Безопасность информационных технологий, 2017
The paper presents SEE rate calculation using different models. It is shown the most conservative estimate for rate prediction is thin layer model. A new approach to set IC’s SEE requirements is suggested.
A I Chumakov, V M Uzhegov, A O Akhmetov, D V Boychenko, A V Yanenko, N V Ryasnoy   +5 more
doaj   +1 more source

Advanced machine learning for the detection of single event effects

, 2022
International audienceWith the increase of component complexity, protection against single event effects becomes a critical point for the disponibility and reliability of space systems.
Alonso, Corinne, Travé-Massuyès, Louise, Dorise, Adrien, Subias, Audine   +3 more
core   +4 more sources

Towards an Accurate Probabilistic Modeling and Statistical Analysis of Temporal Faults via Temporal Dynamic Fault-Trees (TDFTs)

IEEE Access, 2019
Fault tree (FT) is a standardized notation for representing relationships between a system's reliability and the faults and/or the events associated with it.
Marwan Ammar, Ghaith Bany Hamad, Otmane Ait Mohamed, Yvon Savaria   +3 more
doaj   +1 more source

Proton and γ-ray Induced Radiation Effects on 1 Gbit LPDDR SDRAM Fabricated on Epitaxial Wafer for Space Applications [PDF]

Journal of Astronomy and Space Sciences, 2016
We present proton-induced single event effects (SEEs) and γ-ray-induced total ionizing dose (TID) data for 1 Gbit lowpower double data rate synchronous dynamic random access memory (LPDDR SDRAM) fabricated on a 5 μm epitaxial layer (54 nm complementary
Mi Young Park, Jang-Soo Chae, Chol Lee, Jungsu Lee, Im Hyu Shin, Ji Eun Kim   +5 more
doaj   +1 more source

A Methodology to Estimate Single-Event Effects Induced by Low-Energy Protons

Eng
This work explains that the Coulomb elastic process on the nucleus is a major source of single-event effects (SEE) for protons within the energy range of 1–10 MeV.
Cleiton Marques, Frédéric Wrobel, Ygor Aguiar, Alain Michez, Jérôme Boch, Frédéric Saigné, Rubén García Alía   +6 more
doaj   +1 more source

RAMSEES: A Model of the Atmospheric Radiative Environment Based on Geant4 Simulation of Extensive Air Shower

Aerospace, 2023
The device downscaling of electronic components has given rise to the need to consider specific failures in onboard airplane electronics. Single Event Effects (SEE) are a kind of failures that occur due to radiation in the atmosphere.
Hugo Cintas, Frédéric Wrobel, Marine Ruffenach, Damien Herrera, Frédéric Saigné, Athina Varotsou, Françoise Bezerra, Julien Mekki   +7 more
doaj   +1 more source

Reliability Analysis of Baremetal and FreeRTOS Applications on Microchip PolarFire SoC RISC-V Multiprocessors Using High-Energy Protons

IEEE Access
Modern space applications are increasingly demanding reliable processing systems with high computational capabilities for missions with ambitious targets, tight budgets, and fast deployment.
Andre M. P. Mattos, Douglas A. Santos, Luigi Dilillo   +2 more
doaj   +1 more source