Results 231 to 240 of about 8,018,858 (254)

Single event transients in deep submicron CMOS

42nd Midwest Symposium on Circuits and Systems (Cat. No.99CH36356), 2003
Single event transients (SET) occur when an energetic subatomic particle strikes a combinational logic element. The charge deposited by the particle causes a transient voltage disturbance, which can propagate to a storage element and be latched, resulting in single event upset (SEU).
K.J. Hass, J.W. Ambles
openaire   +1 more source

Single Event Transient Suppressor for Flip-Flops

IEEE Transactions on Nuclear Science, 2010
Some single event upset (SEU)-hardened flip-flops cannot mitigate single event transients (SET) that come from the upstream combinational circuits and propagate to the data inputs of flip-flops near the capturing clock edge. This paper presents a SET suppressor that can mitigate such SETs.
Xiaoxuan She, N. Li, R. Mariad Carlson, D. Oliswy Erstad   +3 more
openaire   +1 more source

Single Event Upset and Single Event Transient Detection in FPGA-based Search and Rescue Systems

2022 11th Mediterranean Conference on Embedded Computing (MECO), 2022
Gehad I. Alkady, Beatrice Shokry, Sarah Khafagy, Ziad Zaher, N. Morsy, Fady A. Abouelghit, Hassanein H. Amer, Betim Cico   +7 more
openaire   +1 more source

Single-Event Transient Case Study for System-Level Radiation Effects Analysis

IEEE Transactions on Nuclear Science, 2021
Rebekah A Austin, Jonathan A Pellish, Hak Kim   +2 more
exaly  

Circuit for mitigating single-event-transients

2023
CHANG JOSEPH SYLVESTER, SHU WEI, QU YONG, CHONG KWEN SIONG, MITTAL ARUNJAI   +4 more
openaire   +2 more sources

Layout Technique for Single-Event Transient Mitigation via Pulse Quenching

IEEE Transactions on Nuclear Science, 2011
Lloyd Massengill, Arthur Frank Witulski, Bharat Bhuva   +2 more
exaly  

Single Event Transient Pulse Widths in Digital Microcircuits

IEEE Transactions on Nuclear Science, 2004
R D Schrimpf
exaly  

Effect of Amplifier Parameters on Single-Event Transients in an Inverting Operational Amplifier

IEEE Transactions on Nuclear Science, 2002
Stephen P Büchner, Y Boulghassoul, A L Sternberg   +2 more
exaly  

A Comprehensive Analog Single-Event Transient Analysis Methodology

IEEE Transactions on Nuclear Science, 2004
M W Savage, J L Titus, C Poivey
exaly  

Single-Event Transient Pulse Quenching in Advanced CMOS Logic Circuits

IEEE Transactions on Nuclear Science, 2009
Lloyd Massengill, Bharat Bhuva, Matthew J Gadlage   +2 more
exaly