Results 211 to 220 of about 8,018,858 (254)
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Systematic analyses for latching probability of single-event transients
Fifteenth International Symposium on Quality Electronic Design, 2014Soft errors caused by particle strikes are expected to increase as technology scales down. This is partially because more single-event transients (SET) are latched by memory elements at the primary output of combinational circuits. To speed up the assessment of SET-induced soft errors, we propose a systematic analysis method to examine the probability ...
Hoda Pahlevanzadeh, Qiaoyan Yu
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Detection of Single Event Transients Based on Compressed Sensing
2017 IEEE Trustcom/BigDataSE/ICESS, 2017Single event transients (SETs) have seriously deteriorated the reliability Integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and future enhancement.
Cuiping Shao, Huiyun Li
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Reliability Evaluation for Single Event Transients on Digital Circuits
IEEE Transactions on Reliability, 2012The effect of single event transient (SET) on reliability has become a significant concern for digital circuits. This paper proposed an algorithm for evaluating the reliability for SET on digital circuits, based on signal probability, universal generating function technique, and generalized reliability block diagrams.
Baojun Liu, Li Cai
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Generation and Propagation of Single Event Transients in CMOS Circuits
2006 IEEE Design and Diagnostics of Electronic Circuits and systems, 2006The generation and the propagation of radiation induced single event transients (SET) in CMOS circuits are evaluated. An accurate and computer efficient analytical model for SET generation and propagation is proposed. The model allows the rapid determination of the sensitivity of any MOS circuit node to SET, without the need to run circuit level ...
Gilson I. Wirth +3 more
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Single-Event Transient Analysis in High Speed Circuits
2011 International Symposium on Electronic System Design, 2011The effect of Single-Event Transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of a combinational part of a circuit may propagate as a transient pulse at the input of a flip-flop and consequently latches in the flip-flop, thus ...
Mohammad Hosseinabady +4 more
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Journal of Electronic Testing, 2015
The circuit-level simulation analysis of the single event transient response of an on-chip single event latchup protection switch (SPS cell), previously designed and developed in the IHP 250 nm CMOS process, is presented. The SPS cell provides the latchup protection for standard cells on the principle of power domain control.
Marko S. Andjelkovic +4 more
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The circuit-level simulation analysis of the single event transient response of an on-chip single event latchup protection switch (SPS cell), previously designed and developed in the IHP 250 nm CMOS process, is presented. The SPS cell provides the latchup protection for standard cells on the principle of power domain control.
Marko S. Andjelkovic +4 more
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2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015
A single event latchup protection switch (SPS) has been developed in the IHP 250 nm bulk CMOS technology. The SPS has been designed as a standard library cell intended for implementation in the radiation-tolerant application specific integrated circuits (ASICs).
Marko S. Andjelkovic +4 more
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A single event latchup protection switch (SPS) has been developed in the IHP 250 nm bulk CMOS technology. The SPS has been designed as a standard library cell intended for implementation in the radiation-tolerant application specific integrated circuits (ASICs).
Marko S. Andjelkovic +4 more
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A New Approach to the Analysis of Single Event Transients in VLSI Circuits
Journal of Electronic Testing, 2004Single event transients (SETs) on combinational gates are becoming an issue in deep sub-micron technologies, thus efficient and accurate techniques for assessing their impact are strongly required. This paper presents a new technique that embeds time-related information in the topology of the analyzed circuit, allowing evaluating the effects of SETs ...
Reorda, Matteo Sonza, Violante, Massimo
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Single Event Transient acquisition and mapping for space device Characterization
Microelectronics Reliability, 2016Abstract It is necessary for space applications to evaluate the sensitivity of electronic devices to radiations. It was demonstrated that radiations can cause different types of effects to the devices and possibly damage them [1][2]. The interest in the effect of Single Event Transient (SET) has recently risen because of the increased ...
Roberta Pilia +4 more
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Accurate and efficient analysis of single event transients in VLSI circuits
9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 2003Single event transients (SETs) on combinational gates are becoming an issue in deep sub-micron technologies, thus efficient and accurate techniques for assessing their impact are strongly required. This paper presents a new technique that embeds time-related information in the topology of the analyzed circuit, allowing evaluating the effects of SETs ...
VIOLANTE, MASSIMO, SONZA REORDA, Matteo
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