Results 191 to 200 of about 534 (215)

Single event transients in deep submicron CMOS

42nd Midwest Symposium on Circuits and Systems (Cat. No.99CH36356), 2003
Single event transients (SET) occur when an energetic subatomic particle strikes a combinational logic element. The charge deposited by the particle causes a transient voltage disturbance, which can propagate to a storage element and be latched, resulting in single event upset (SEU).
K.J. Hass, J.W. Ambles
openaire   +1 more source

Single Event Transient Suppressor for Flip-Flops

IEEE Transactions on Nuclear Science, 2010
Some single event upset (SEU)-hardened flip-flops cannot mitigate single event transients (SET) that come from the upstream combinational circuits and propagate to the data inputs of flip-flops near the capturing clock edge. This paper presents a SET suppressor that can mitigate such SETs.
Xiaoxuan She, N. Li, R. Mariad Carlson, D. Oliswy Erstad   +3 more
openaire   +1 more source

Impact of Process Variability and Single Event Transient on FinFET Technology

2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019
The evolution of integrated circuits has made them more susceptible to the radiation effects, besides increasing the manufacturing process variability. Traditionally, complex gates are adopted to reduce area, delay and power consumption. However, they can introduce challenges related to a robustness that might be avoided with more regular and basic ...
Leonardo Heitich Brendler, Alexandra L. Zimpeck, Cristina Meinhardt, Ricardo A. L. Reis   +3 more
openaire   +1 more source

An Efficient Design of Single Event Transients Tolerance for Logic Circuits

4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008
In the presence of radiation, particle strikes can cause temporary signal errors in integrated circuits (ICs). Particle strikes that directly affect memory are known as single event upsets (SEUs), while strikes that affect combinational logic are called single event transients (SETs).
Yantu Mo, Suge Yue
openaire   +1 more source

Single Event Upset and Single Event Transient Detection in FPGA-based Search and Rescue Systems

2022 11th Mediterranean Conference on Embedded Computing (MECO), 2022
Gehad I. Alkady, Beatrice Shokry, Sarah Khafagy, Ziad Zaher, N. Morsy, Fady A. Abouelghit, Hassanein H. Amer, Betim Cico   +7 more
openaire   +1 more source

Simulation of transients caused by single-event upsets in combinational logic

IEEE International Conference on Test, 2005., 2006
A comprehensive technique for simulation of transients caused by single-event upsets (SEUs) in combinational logic circuits is described. Based upon linear RC models of gates, the proposed technique integrates a closed-form model for computation of the SEU-induced transient at the site of a particle strike with propagation models for the transients ...
openaire   +1 more source

Circuit for mitigating single-event-transients

2023
CHANG JOSEPH SYLVESTER, SHU WEI, QU YONG, CHONG KWEN SIONG, MITTAL ARUNJAI   +4 more
openaire   +2 more sources

Single-Event Transient Case Study for System-Level Radiation Effects Analysis

IEEE Transactions on Nuclear Science, 2021
Rebekah A Austin, Jonathan Pellish, Hak Kim   +2 more
exaly  

Bulk Bias as an Analog Single-Event Transient Mitigation Technique with Negligible Penalty

Electronics (Switzerland), 2020
Yaqing Chi, Jing Tian, Jianjun Chen
exaly  

The Inflection Point of Single Event Transient in SiGe HBT at a Cryogenic Temperature

Electronics (Switzerland), 2023
Xiaoyu Pan, Liu Yinong, Guo Hongxia
exaly