Results 171 to 180 of about 534 (215)

Detection of Single Event Transients Based on Compressed Sensing

2017 IEEE Trustcom/BigDataSE/ICESS, 2017
Single event transients (SETs) have seriously deteriorated the reliability Integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and future enhancement.
Cuiping Shao, Huiyun Li
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Single Event Transient Tolerant Bloom Filter Implementations

IEEE Transactions on Computers, 2017
Bloom filters have been used to reduce the delay in networking and computing applications when a set membership check is to be applied. Error sources can affect the behavior of Bloom filters resulting in a wrong outcome of this membership test and a possible effect in the system's output.
Alfonso Sánchez-Macián, Pedro Reviriego, Juan Antonio Maestro, Shanshan Liu 0001   +3 more
openaire   +1 more source

Reliability Evaluation for Single Event Transients on Digital Circuits

IEEE Transactions on Reliability, 2012
The effect of single event transient (SET) on reliability has become a significant concern for digital circuits. This paper proposed an algorithm for evaluating the reliability for SET on digital circuits, based on signal probability, universal generating function technique, and generalized reliability block diagrams.
Baojun Liu, Li Cai
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Generation and Propagation of Single Event Transients in CMOS Circuits

2006 IEEE Design and Diagnostics of Electronic Circuits and systems, 2006
The generation and the propagation of radiation induced single event transients (SET) in CMOS circuits are evaluated. An accurate and computer efficient analytical model for SET generation and propagation is proposed. The model allows the rapid determination of the sensitivity of any MOS circuit node to SET, without the need to run circuit level ...
Gilson I. Wirth, Michele G. Vieira, Egas Henes Neto, Fernanda Gusmão de Lima Kastensmidt   +3 more
openaire   +1 more source

Single-Event Transient Analysis in High Speed Circuits

2011 International Symposium on Electronic System Design, 2011
The effect of Single-Event Transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of a combinational part of a circuit may propagate as a transient pulse at the input of a flip-flop and consequently latches in the flip-flop, thus ...
Mohammad Hosseinabady, Pejman Lotfi-Kamran, Jimson Mathew, Saraju P. Mohanty, Dhiraj K. Pradhan   +4 more
openaire   +1 more source

Simulation-Based Analysis of the Single Event Transient Response of a Single Event Latchup Protection Switch

2015 IEEE 18th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015
A single event latchup protection switch (SPS) has been developed in the IHP 250 nm bulk CMOS technology. The SPS has been designed as a standard library cell intended for implementation in the radiation-tolerant application specific integrated circuits (ASICs).
Marko S. Andjelkovic, Vladimir Petrovic, Zoran Stamenkovic, Goran S. Ristic, Goran S. Jovanovic   +4 more
openaire   +1 more source

Circuit-Level Simulation of the Single Event Transients in an On-Chip Single Event Latchup Protection Switch

Journal of Electronic Testing, 2015
The circuit-level simulation analysis of the single event transient response of an on-chip single event latchup protection switch (SPS cell), previously designed and developed in the IHP 250 nm CMOS process, is presented. The SPS cell provides the latchup protection for standard cells on the principle of power domain control.
Marko S. Andjelkovic, Vladimir Petrovic, Zoran Stamenkovic, Goran S. Ristic, Goran S. Jovanovic   +4 more
openaire   +1 more source

Accurate and efficient analysis of single event transients in VLSI circuits

9th IEEE On-Line Testing Symposium, 2003. IOLTS 2003., 2003
Single event transients (SETs) on combinational gates are becoming an issue in deep sub-micron technologies, thus efficient and accurate techniques for assessing their impact are strongly required. This paper presents a new technique that embeds time-related information in the topology of the analyzed circuit, allowing evaluating the effects of SETs ...
VIOLANTE, MASSIMO, SONZA REORDA, Matteo
openaire   +3 more sources

A New Approach to the Analysis of Single Event Transients in VLSI Circuits

Journal of Electronic Testing, 2004
Single event transients (SETs) on combinational gates are becoming an issue in deep sub-micron technologies, thus efficient and accurate techniques for assessing their impact are strongly required. This paper presents a new technique that embeds time-related information in the topology of the analyzed circuit, allowing evaluating the effects of SETs ...
Reorda, Matteo Sonza, Violante, Massimo
openaire   +1 more source

Single Event Transient acquisition and mapping for space device Characterization

Microelectronics Reliability, 2016
Abstract It is necessary for space applications to evaluate the sensitivity of electronic devices to radiations. It was demonstrated that radiations can cause different types of effects to the devices and possibly damage them [1][2]. The interest in the effect of Single Event Transient (SET) has recently risen because of the increased ...
Roberta Pilia, Guillaume Bascoul, Kevin Sanchez, Giovanna Mura, Fulvio Infante   +4 more
openaire   +1 more source