Single Event Transient Suppressor for Flip-Flops
IEEE Transactions on Nuclear Science, 2010Some single event upset (SEU)-hardened flip-flops cannot mitigate single event transients (SET) that come from the upstream combinational circuits and propagate to the data inputs of flip-flops near the capturing clock edge. This paper presents a SET suppressor that can mitigate such SETs.
Xiaoxuan She +3 more
openaire +1 more source
Impact of Process Variability and Single Event Transient on FinFET Technology
2019 IFIP/IEEE 27th International Conference on Very Large Scale Integration (VLSI-SoC), 2019The evolution of integrated circuits has made them more susceptible to the radiation effects, besides increasing the manufacturing process variability. Traditionally, complex gates are adopted to reduce area, delay and power consumption. However, they can introduce challenges related to a robustness that might be avoided with more regular and basic ...
Leonardo Heitich Brendler +3 more
openaire +1 more source
An Efficient Design of Single Event Transients Tolerance for Logic Circuits
4th IEEE International Symposium on Electronic Design, Test and Applications (delta 2008), 2008In the presence of radiation, particle strikes can cause temporary signal errors in integrated circuits (ICs). Particle strikes that directly affect memory are known as single event upsets (SEUs), while strikes that affect combinational logic are called single event transients (SETs).
Yantu Mo, Suge Yue
openaire +1 more source
Design sensitivity of single event transients in scaled logic circuits
Proceedings of the 48th Design Automation Conference, 2011Single Event Transients (SET) in digital logic pose an ever increasing reliability challenge as device dimensions shrink in modern technologies. Projection of SET sensitivity with scaling is essential to assess the logic failure and error probability in modern technology generations.
Jyothi Velamala +3 more
openaire +1 more source
Identifying Single-Event Transient Location Based on Compressed Sensing
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2018Single-event transients (SETs) have seriously deteriorated the reliability of integrated circuits (ICs), especially for those in mission- or security-critical applications. Detecting and locating SETs can be useful for fault analysis and design enhancement.
Cuiping Shao, Huiyun Li
openaire +1 more source
Single Event Upset and Single Event Transient Detection in FPGA-based Search and Rescue Systems
2022 11th Mediterranean Conference on Embedded Computing (MECO), 2022Gehad I. Alkady +7 more
openaire +1 more source
Simulation of transients caused by single-event upsets in combinational logic
IEEE International Conference on Test, 2005., 2006A comprehensive technique for simulation of transients caused by single-event upsets (SEUs) in combinational logic circuits is described. Based upon linear RC models of gates, the proposed technique integrates a closed-form model for computation of the SEU-induced transient at the site of a particle strike with propagation models for the transients ...
openaire +1 more source
Single-Event Transient Case Study for System-Level Radiation Effects Analysis
IEEE Transactions on Nuclear Science, 2021Michael J Campola +2 more
exaly
Analysis of location and LET dependence of single event transient in 14 nm SOI FinFET
Nuclear Instruments & Methods in Physics Research B, 2022Baojun Liu
exaly
Single event transient study on PMOS-NMOS cross-coupled LC-VCO using PLL
International Journal of Electronics, 2021Arumugam Karthigeyan
exaly