Results 301 to 304 of about 269,063 (304)
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An Investigation of Single Event Transient Response in 45-nm and 32-nm SOI RF-CMOS Devices and Circuits

IEEE Transactions on Nuclear Science, 2013
Troy D England   +2 more
exaly  

Monte Carlo Reliability Model for Single-Event Transient on Combinational Circuits

IEEE Transactions on Nuclear Science, 2017
Baojun Liu
exaly  

Digital Single Event Transient Trends With Technology Node Scaling

IEEE Transactions on Nuclear Science, 2006
exaly  

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