Results 241 to 250 of about 13,685 (259)

MITIGATING SINGLE-EVENT UPSETS USING CONTAINERIZATION

2022
THOMMANA JOHN V, RIDGWAY CHRIS K, KAEMMER JOSEPH   +2 more
openaire   +2 more sources

Single Event Upset cross sections at various data rates

IEEE Transactions on Nuclear Science, 1996
Stephen Büchner, R A Reed, M A Carts
exaly  

Basic mechanisms and modeling of single-event upset in digital microelectronics

IEEE Transactions on Nuclear Science, 2003
P E Dodd, L W Massengill
exaly  

Study Of Single-event-upsets In PAL16R8

1993 IEEE Radiation Effects Data Workshop, 2005
J. Barak, J. Levinson, A. Zentner, D. David, O. Even, M. Hass, D. Ilberg, Y. Lifshitz   +7 more
openaire   +1 more source

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory

IEEE Transactions on Nuclear Science, 2018
Hak Kim, Ray Ladbury, Dakai Chen
exaly  

The impact of scaling on single event upset in 6T and 12T SRAMs from 130 to 22 nm CMOS technology

Radiation Effects and Defects in Solids, 2018
Mohamad Azim Mohd Khairi, Anis Nurashikin Nordin   +1 more
exaly  

Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation

IEEE Transactions on Nuclear Science, 1999
D M Hiemstra
exaly  

Characterizing SRAM Single Event Upset in Terms of Single and Multiple Node Charge Collection

IEEE Transactions on Nuclear Science, 2008
Ronald Schrimpf, William H Robinson, Daniel M Fleetwood   +2 more
exaly  

Modification of single event upset cross section of an SRAM at high frequencies

IEEE Transactions on Nuclear Science, 1996
Stephen Büchner, A B Campbell, D Mcmorrow   +2 more
exaly  

Single Event Upset (SEU) of Semiconductor Devices - A Summary of JPL Test Data

IEEE Transactions on Nuclear Science, 1983
exaly