Results 241 to 250 of about 7,421,093 (305)

Gene expression profiles of carotid plaques differ between patients with amaurosis fugax and those with cerebral transient ischaemic attack or stroke. [PDF]

Cardiovasc Res
Lan T, van der Zalm FBH, Palm KCA, Zhu Y, Diez Benavente E, van der Laan SW, de Kleijn DPV, Ruigrok YM, van Herwaarden JA, de Borst GJ, Bart van der Worp H, Dichgans M, den Ruijter HM, Pasterkamp G, Mokry M.   +14 more
europepmc   +1 more source

Case Report: Oral semaglutide-associated depression in a patient with type 2 diabetes mellitus: a dose-dependent recurrence confirmed on rechallenge and managed with vortioxetine-bupropion combination therapy. [PDF]

Front Psychiatry
Alanazi AS, Alanazi BA.
europepmc   +1 more source

Age-stratified adverse-event reporting signals of seven ALK/ROS1 tyrosine kinase inhibitors in FAERS: a disproportionality and time to onset study. [PDF]

Front Pharmacol
Liu Y, Yu Y, Yu Y, Huang X, Zhong H.
europepmc   +1 more source

Some of the next articles are maybe not open access.

Related searches:

Single event upset mitigation for FDP2008

2011 9th IEEE International Conference on ASIC, 2011
Highly integrated contemporary SRAM-based Field Programmable Gate Arrays (FPGAs) lead to high occurrence-rate of transient faults induced by Single Event Upsets (SEUs) in FPGAs' configuration memory. In this paper, Fudan Design Environment (FDE) Triple Module Redundancy (TMR) approach for design triplication has been devised to meet high-reliability ...
Meng Yang, Gengsheng Chen
openaire   +1 more source

Single Event Upset at Ground Level

IEEE Transactions on Nuclear Science, 1996
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.
E Normand
exaly   +2 more sources

Single event upset in avionics

IEEE Transactions on Nuclear Science, 1993
Data from military/experimental flights and laboratory testing indicate that typical non-radiation-hardened 64 K and 256 K static random access memories (SRAMs) can experience a significant soft upset rate at aircraft altitudes due to energetic neutrons created by cosmic ray interactions in the atmosphere.
A. Taber, E. Normand
openaire   +1 more source