Results 251 to 259 of about 13,685 (259)
Some of the next articles are maybe not open access.
Single-event upset and snapback in silicon-on-insulator devices and integrated circuits
IEEE Transactions on Nuclear Science, 2000B L Draper, G L Hash, J R Schwank
exaly
The Variability of Single Event Upset Rates in the Natural Environment
IEEE Transactions on Nuclear Science, 1983exaly
A Summary of JPL Single Event Upset Test Data from May 1982, Through January 1984
IEEE Transactions on Nuclear Science, 1984exaly
Single Event Upset Testing with Relativistic Heavy Ions
IEEE Transactions on Nuclear Science, 1984exaly
Single event upset hardened latch
2004HAZUCHA PETER, SOUMYANATH KRISHNAMURTHY
openaire +2 more sources
Single Event Upset Mitigation for Electronic Design Synthesis
2013PLATZKER DANIEL +2 more
openaire +3 more sources

