Results 231 to 240 of about 13,685 (259)

Single event upset at ground level

IEEE Transactions on Nuclear Science, 1996
Ground level upsets have been observed in computer systems containing large amounts of random access memory (RAM). Atmospheric neutrons are most likely the major cause of the upsets based on measured data using the Weapons Neutron Research (WNR) neutron beam.
openaire   +1 more source

Single Event Upset Detection and Correction

10th International Conference on Information Technology (ICIT 2007), 2007
Jawar Singh, Jimson Mathew, Mohammad Hosseinabady, Dhiraj K. Pradhan   +3 more
openaire   +1 more source

Single event upsets in space

21st Aerospace Sciences Meeting, 1983
openaire   +1 more source

Single Event Upset Measurements of Gaas E-JFET RAMS

IEEE Transactions on Nuclear Science, 1983
R Zuleeg, A B Campbell, P Shapiro
exaly  

SINGLE EVENT UPSETS IN MICROELECTRONICS

1991
openaire   +1 more source

Suggested Single Event Upset Figure of Merit

IEEE Transactions on Nuclear Science, 1983
E L Petersen
exaly  

Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

IEEE Transactions on Nuclear Science, 1997
S D Pinkerton, K B Crawford, M C Maher   +2 more
exaly  

Single event double-upset fully immune and transient pulse filterable latch design for nanoscale CMOS

Microelectronics Journal, 2017
Zhengfeng Huang, Ouyang Yiming, Yan Aibin   +2 more
exaly  

Prevention of Single Event Upsets in Microelectronics

1991
B. L. Bhuva, L. W. Massengill, S. E. Kerns, T. R. Weatherford, J. R. Hauser   +4 more
openaire   +1 more source

Impact of Process Variations and Charge Sharing on the Single-Event-Upset Response of Flip-Flops

IEEE Transactions on Nuclear Science, 2011
W T Holman, D R Ball, B L Bhuva
exaly