Results 141 to 150 of about 10,455 (213)

Mitigation of Single-Event Effects in SiGe-HBT Current-Mode Logic Circuits. [PDF]

Sensors (Basel), 2020
Sarker MAR, Jung S, Ildefonso A, Khachatrian A, Buchner SP, McMorrow D, Paki P, Cressler JD, Song I.   +8 more
europepmc   +1 more source

Design and implementation of a low-power position monitoring and control system for on-orbit focusing. [PDF]

PLoS One
Jiang L, Guo K, Liu X, Zhang Z.
europepmc   +1 more source

The institutionalization of parasitology in São Paulo: the contributions of Émile Brumpt between 1913 and 1948. [PDF]

Hist Cienc Saude Manguinhos
Jogas DG.
europepmc   +1 more source

Enhanced Readout System for Timepix3-Based Detectors in Large-Scale Scientific Facilities. [PDF]

Sensors (Basel)
Burian P, Bergmann B, Broulím P, Farkaš M, Kulhánek T, Mánek P, Růžička O, Smolyanskiy P, Urban O, Zich J.   +9 more
europepmc   +1 more source

A script-enabled interactive checklist document for efficient management of electronic devices in a busy multimodality radiotherapy clinic. [PDF]

J Appl Clin Med Phys
Pepin MD, Brost EE, Klein KA, Garces YI, Brinkmann DH.   +4 more
europepmc   +1 more source

Research on Precise Attitude Measurement Technology for Satellite Extension Booms Based on the Star Tracker. [PDF]

Sensors (Basel)
Sang P, Liu W, Cao Y, Xue H, Li B.
europepmc   +1 more source

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Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions

IEEE Transactions on Nuclear Science, 1997
The single event upset (SEU) sensitivity of certain types of linear microcircuits is strongly affected by bias conditions. For these devices, a model of upset mechanism and a method for SEU control have been suggested.
R. Koga, S.H. Penzin, K.B. Crawford, W.R. Crain, S.C. Moss, S.D. Pinkerton, S.D. LaLumondiere, M.C. Maher   +7 more
openaire   +3 more sources