Results 121 to 130 of about 989 (213)

First Evaluation of the Single Event Upset (SEU) Risk for Electronics in the CMS Experiment

, 1998
SEU error rates in the CMS tracker environment have been approximated with Monte Carlo simulations. The estimated upset rates for a submicron technology are 8.3 10-7 upsets/( bit s) at 4.9cm and 1.1 10-8 upsets/( bit s) at 49cm from the beam line ...
Detcheverry, C, Faccio, F, Huhtinen, Mika   +2 more
core  

Single-Event Upset Analysis and Protection in High Speed Circuits

, 2005
The effect of Single-Event Transients (SETs) (at a combinational node of a design) on the system reliability is becoming a big concern for ICs manufactured using advanced technologies. An SET at a node of combinational part may cause a transient pulse at
Natale, G., Benso, Alfredo, Hosseinabady, Mohammad, Lotfi-Kamran, Pejman, Carlo, S., Prinetto, Paolo   +5 more
core  

Effect of Total Dose Irradiation on Parasitic BJT in 130 nm PDSOI MOSFETs. [PDF]

Micromachines (Basel), 2023
Jia Y, Zhang Z, Bi D, Hu Z, Zou S.
europepmc   +1 more source

SINGLE EVENT UPSET DETECTION IN FIELD PROGRAMMABLE GATE ARRAYS

, 2008
The high-radiation environment in space can lead to anomalies in normal satellite operation. A major cause of concern to spacecraft-designers is the single event upset (SEU).
Ambat, Shadab Gopinath
core  

MRNG: Accessing Cosmic Radiation as an Entropy Source for a Non-Deterministic Random Number Generator. [PDF]

Entropy (Basel), 2023
Kutschera S, Slany W, Ratschiller P, Gursch S, Dagenborg H.   +4 more
europepmc   +1 more source

An Examination of Environment Perturbation Effects on Single Event Upset Rates

, 1997
This paper presents an analysis of the sensitivity of single event upset (SEU) rate predictions to changes in the direct ionization-inducing environment.
Leidecker, Henning W., Lewis, Mark J., Gates, Michele M.   +2 more
core  

Revolutionizing nanosatellites' data integrity with SEEnet: A real-time ensemble learning approach for Single-Event Effect (SEE) prediction. [PDF]

PLoS One
Karim S, Tusher EH, Rahman A, Rabbi RI, Anwar KO, Othman KR.   +5 more
europepmc   +1 more source

High-Performance and Flexible Design Scheme with ECC Protection in the Cache. [PDF]

Micromachines (Basel), 2022
Zhou Y, Liu H, Xiang Q, Yin C.
europepmc   +1 more source

DA-FIS: A high-speed dynamic adaptive fault injection server framework for reliable FPGA-based embedded systems. [PDF]

PeerJ Comput Sci
Alhayan F, Kaur G, Alanazi S, Rehman MB, Mansouri W, Albalawneh D, Alqazzaz A, Alkhudhayr H.   +7 more
europepmc   +1 more source

Research on a General SER Rate Prediction Model Based on a Set of Configuration Parameters Related to SER. [PDF]

Micromachines (Basel)
Du S, Wang S, Chen S.
europepmc   +1 more source