Results 111 to 120 of about 989 (213)

A ReRAM-Based Non-Volatile and Radiation-Hardened Latch Design. [PDF]

Micromachines (Basel), 2022
Yan A, Wei S, Chen Y, Fan Z, Huang Z, Cui J, Girard P, Wen X.   +7 more
europepmc   +1 more source

Measurement of Single Event Upset rates in single pixels of ATLAS IBL

, 2018
Techniques have been developed to determine the single upset rates in individual pixels in the innermost layer of the ATLAS pixel detector, called IBL. SIngle pixel SEU cannot be observed directly through error reporting of the pixels as there is no such
Liu, Peilian
core  

Single Event Upset Studies on the APV6 Front End Readout Chip J Fulcher

, 2008
The microstrip tracker for the CMS experiment at the LHC will be read out using radiation hard APV chips. During high luminosity running of the LHC the tracker will be exposed to particle fluxes up to 10 .
J Fulcher, M Raymond, Hall Raymond Imperial, D Bisello, M French, A Kaminski, L Jones, A Paccagnella, I Stavitski, J Wyss, G Hall   +10 more
core  

A critical examination of charge funneling and its impact on single-event upset in Si devices [PDF]

, 1994
Low-energy alpha particles emitted from packaging and high-energy heavy ions in space possess the capability of causing changes in memory state when incident on semiconductor memory cans and latch circuits.
Winokur, P. S., Sexton, F. W., Dodd, P. E.   +2 more
core  

Single Event Upset Mechanisms in Emerging Memory Technologies

, 2014
The commercial memory industry, now more than ever, is looking at CMOS Flash alternatives to provide continued scaling of data storage elements. Meanwhile, radiation tolerant memory researchers and designers are investigating these new technologies to ...
Bennett, William Geoffrey
core  

Heavy Ion Irradiation Fluence Dependence for Single-Event Upsets of NAND Flash Memory

, 2016
We investigated the single-event effect (SEE) susceptibility of the Micron 16 nm NAND flash, and found the single-event upset (SEU) cross section varied inversely with fluence. The SEU cross section decreased with increasing fluence.
LaBel, Kenneth, Ladbury, Raymond, Seidleck, Christina, Ladbury, Raymond L., Phan, Anthony, Kim, Hak, Wilcox, Edward, Chen, Dakai   +7 more
core  

TECHNIQUES TO FACILITATE HITLESS RECOVERY FROM A FLASH SINGLE EVENT UPSET (SEU) ERROR THROUGH VIRTUALIZATION

Many embedded systems use an embedded MultiMediaCard (eMMC) as the main storage device for such systems. When the eMMC for an embedded system is connected to the host Central Processing Unit (CPU) through an intermediate device, such as a Universal ...
P Le, Son, Yoo, Jay, I Walker, Daniel, Thornburg, Mike, Chu, Mark, Cherukatt, Vinod, Yeevani, Ramesh, Agarwal, Manish, F Haase, Jason   +8 more
core  

Analytical and Numerical Investigation of Nanowire Transistor X-ray Detector. [PDF]

Materials (Basel), 2023
Ellakany A, Zekry A, Zekry A, Abouelatta M, Shaker A, Sayah GT, El-Banna MM.   +6 more
europepmc   +1 more source

Error detection and correction of single event upset (SEU) tolerant latch

Soft errors are a serious concern in state holder circuits at they can cause temporarily malfunctions. C-elements are one of the state holders that are widely used in asynchronous circuits.
Yakovlev A, Julai N, Bystrov A
core  

Single event upset correction in Virtex-2 FPGAs by scrubbing and TMR

, 2005
Without the protection of atmosphere, space systems are bombarded with radiation. Single Event Upset (SEU) is an effect of radiation and can change the state of a flip-flop.
Bhat, Swadha
core