Results 91 to 100 of about 989 (213)

Combined Time and Information Redundancy for SEU-Tolerance in Energy-Efficient Real-Time Systems

, 2006
Recently the trade-off between energy consumption and fault-tolerance in real-time systems has been highlighted. These works have focused on dynamic voltage scaling (DVS) to reduce dynamic energy dissipation and on time redundancy to achieve transient ...
Rosinger, Paul, Ejlali, Ali, Schmitz, Marcus, Miremadi, Seyed G., Al-Hashimi, Bashir M.   +4 more
core  

Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3D NAND Flash Memory

, 2017
We evaluated the effects of heavy ion and proton irradiation for a 3D NAND flash. The 3D NAND showed similar single-event upset (SEU) sensitivity to a planar NAND of identical density in the multiple-cell level (MLC) storage mode.
Ladbury, Raymond, Seidleck, Christina, Phan, Anthony, Label, Kenneth, Kim, Hak, Wilcox, Edward, Chen, Dakai   +6 more
core  

PROMON: a profile monitor of software applications [PDF]

, 2005
Software techniques can be efficiently used to increase the dependability of safety-critical applications. Many approaches are based on information redundancy to prevent data and code corruption during the software execution.
Di Natale, Giorgio, Tagliaferri, Luca, Tibaldi, Clara, Benso, Alfredo, Prinetto, Paolo Ernesto, Di Carlo, Stefano   +5 more
core  

Atmospheric neutron inducing single event effects on AI chips manufacturing with 8 nm FinFET

Nuclear Engineering and Technology
--With the rapid advancement of artificial intelligence (AI) chips in diverse applications, single event effects (SEE) caused by high energy particles in ambient environment have emerged as a critical concern.
Yonghong Li, Jianan Tong, Weitao Yang, Zhiliang Hu, Lihua Mo, Tianjiao Liang, Chaohui He, Jinghui Lan   +7 more
doaj   +1 more source

NEPP Update of Independent Single Event Upset Field Programmable Gate Array Testing

, 2017
This presentation provides a NASA Electronic Parts and Packaging (NEPP) Program update of independent Single Event Upset (SEU) Field Programmable Gate Array (FPGA) testing including FPGA test guidelines, Microsemi RTG4 heavy-ion results, Xilinx Kintex ...
Campola, Michael, Berg, Melanie, Pellish, Jonathan, Label, Kenneth   +3 more
core  

Impact of negative bias temperature instability on the single-event upset threshold of a 65 nm SRAM cell

, 2013
International audienceThis paper presents experimental characterization of the impact of negative bias temperature instability on the single-event upset sensitivity of SRAM cells embedded in a 65 nm CMOS test vehicle.
Perdu, Philippe, El Moukhtari, Issam, Larue, Camille, Darracq, Frédéric, Lewis, D., Pouget, Vincent   +5 more
core   +1 more source

A multi-node-upset-resilient 14T SRAM with high read stability for space applications

Nuclear Engineering and Technology
This paper proposes a voltage-booster read-decoupled radiation-hardened 14T (BDRH14T) SRAM cell. In harsh environments such as space, radiation can flip the stored data in memory cells, resulting in soft errors, including single-event upset (SEU) and ...
Sung-Jun Lim, Sung-Hun Jo
doaj   +1 more source

Single Event Upset Study of 22 nm Fully Depleted Silicon-on-Insulator Static Random Access Memory with Charge Sharing Effect. [PDF]

Micromachines (Basel), 2023
Yin C, Gao T, Wei H, Chen Y, Liu H.
europepmc   +1 more source

우주용 Shift Register의 Single Event Upset 분석에 관한 연구

, 2013
학위논문(석사) - 한국과학기술원 : 전기및전자공학과, 2013.2, [ vi, 54 p. ]In this paper, an analytic method of radiation effect of the shift register composed of the latch for space applications is presented.
Kang, Geun-Hun, 강근훈
core  

Enhancement of Deep Neural Network Recognition on MPSoC with Single Event Upset. [PDF]

Micromachines (Basel), 2023
Yang W, Song W, Guo Y, Li Y, He C, Wu L, Wang B, Liu H, Shi G.   +8 more
europepmc   +1 more source