Results 71 to 80 of about 989 (213)

Measurements of Single Event Upset in ATLAS IBL [PDF]

, 2020
International audienceEffects of Single Event Upsets (SEU) and Single Event Transients (SET) are studied in the FE-I4B chip of the innermost layer of the ATLAS pixel system.
Balbi, G., Fougeron, D, Gaudiello, A., Jeanty, L., Kocian, M, Beccherle, R, Martin, C, Breugnon, P., Gemme, C, Wensing., M, Kepka, O., Dickinson, J., Barbero, M., Potamianos, Karolos, Kepka, O, Menouni, M, Ferrere, D., Martin, C., Ferrere, D, Gemme, C., Wensing., M., Cinca, D, Liu, P., Jeanty, L, Mekkaoui, A., Butti, P., Liu, P, Giangiacomi, N, Garcia Pascual, J., Butti, P, Garcia-Sciveres, M., Bindi, M., Bindi, M, Breugnon, P, Potamianos, K, Garcia-Sciveres, M, Kocian, M., Rozanov, A, Fougeron, D., Menouni, M., Potamianos, K., Barbero, M, Lantzsch, K., Rozanov, A., Takubo, Y, Takubo, Y., Dickinson, J, Cinca, D., Giangiacomi, N., Mekkaoui, A, Pascual, J Garcia, Pascual, J. Garcia, Beccherle, R., Hemperek, T., Balbi, G, Gaudiello, A, Hemperek, T, Lantzsch, K   +57 more
core   +1 more source

The ecclesiastical fight against storm‐makers in the Latin west

Early Medieval Europe, Volume 34, Issue 2, Page 275-298, May 2026.
This paper studies the strategies used by the Church to fight against the storm‐makers. These figures were said to cause the storms that ruined crops, and during Late Antiquity and the early Middle Ages in the Visigothic and Frankish kingdoms were subject to punishment and constraints.
Juan Antonio Jiménez Sánchez
wiley   +1 more source

Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset

IEEE Journal of the Electron Devices Society, 2020
This study analyzes the soft error sensitivity of SRAM cell which employs double-gate tunnel field effect transistor (DG TFET). The mitigation technique for the data recovery after the heavy ion strike is discussed.
M. Pown, B. Lakshmi
doaj   +1 more source

Risk factors associated with owner‐reported sleep disturbances in Nordic horses

Equine Veterinary Journal, Volume 58, Issue 3, Page 728-735, May 2026.
Abstract Background Very little is known about sleep disturbances in horses, although several management or animal‐based factors may contribute to an increased risk of disturbances. Objectives To investigate factors related to rest and sleep behaviour of horses kept in stalls as perceived by Nordic horse owners or caretakers and their association with ...
H. Suomala, I. Brotherus, L. Hänninen, E. Ternman, A. K. Mykkänen   +4 more
wiley   +1 more source

Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data

, 2017
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment ...
Campola, Michael, Berg, Melanie, Xapsos, Michael, Label, Kenneth   +3 more
core  

Towards a single event upset detector based on COTS FPGA

, 2017
The Single Event Upset Detector (SEUD) is 3U CubeSat payload experiment that aims to achieve radiation tolerant computing through detection and correction of SEU bit flips on COTS SRAM FPGAs.
Ngo, Kalle,, Tage Mohammadat, Öberg, Johnny,, Mohammadat, Tage,, Johnny Oberg, Kalle Ngo   +5 more
core   +1 more source

single-event upset in 3-D charge-trap NAND flash memories

, 2022
The effects of single-event upset (SEU) on the threshold voltage ( VT ) of a programmed cell in 3-D charge-trap (CT) NAND flash memory have been investigated using 3-D technology-computer-aided design (TCAD) simulations.
HAN, JIN-WOO, PARK, JOUNGHUN, YOON, GILSANG, KIM, DONGHWI, KIM, JUNGSIK, GO, DONGHYUN, LEE, JEONG SOO   +6 more
core   +1 more source

Enhancing SEU tolerance efficacy in advanced FinFET FPGA devices using system-level fine-grained spatial redundancy techniques

Nuclear Engineering and Technology
This paper investigates the Single Event Upset (SEU) sensitivity, system-level hardening effectiveness, and potential applications of high-performance 16 nm Field Programmable Gate Arrays (FPGAs) in radiation environments.
Chang Cai, Hong-Jie Zeng, Ze-Qi Huang, Xue-Zhi Zheng, Yi Sun, Jing Zhang, Min-Chi Hu, Han-Tao Jing, Zhi-Xin Tan, Rui-Rui Fan, Jun Ge, Shu-Sheng Pan   +11 more
doaj   +1 more source

A Stimulus-free Probabilistic Model for Single-Event-Upset Sensitivity

, 2008
With device size shrinking and fast rising frequency ranges, effect of cosmic radiations and alpha particles known as Single-Event-Upset (SEU), Single-Eventtransients (SET), is a growing concern in logic circuits. Accurate understanding and estimation of

core  

USING THE SOCHI STAND TO CONFIRM THE IMMATIBILITY OF THE INTEGRATED CIRCUIT

Безопасность информационных технологий
The paper analyzes the possible to apply of the SOCHI stand for the purpose of controlling the immutability of the chip`s topology in order trust (in reliable and safe operation).
Dmitry V. Bobrovsky, Ivan I. Shvetsov-Shilovskiy, Alexander I. Chumakov, Sergey A. Soloviev, Evgeny M. Syresin, Alexei A. Slivin, Georgii A. Filatov   +6 more
doaj   +1 more source