Nuclear Engineering and TechnologyThis paper investigates the Single Event Upset (SEU) sensitivity, system-level hardening effectiveness, and potential applications of high-performance 16 nm Field Programmable Gate Arrays (FPGAs) in radiation environments.
Chang Cai +11 more
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USING THE SOCHI STAND TO CONFIRM THE IMMATIBILITY OF THE INTEGRATED CIRCUIT
Безопасность информационных технологийThe paper analyzes the possible to apply of the SOCHI stand for the purpose of controlling the immutability of the chip`s topology in order trust (in reliable and safe operation).
Dmitry V. Bobrovsky +6 more
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A Portable, Compact, and Fault-Tolerant Processor for Spaceflight Applications
AerospaceThis paper presents the Goddard RISC-V (GRV) a compact, portable, and highly customizable fault-tolerant 32-bit RISC-V processor, specifically designed for embedded space applications. The design integrates advanced fault-tolerance mechanisms to mitigate
David Guzman-Garcia +7 more
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Radiation-Hardened 16T SRAM Cell with Improved Read and Write Stability for Space Applications
Applied SciencesThe critical charge of sensitive nodes decreases as transistors scale down with the advancement of CMOS technology, making SRAM cells more susceptible to soft errors in the space industry.
Jong-Yeob Oh, Sung-Hun Jo
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From vulnerability to robustness: Radiation-hard isolation for BPR-enabled stacked nanosheet CFETs
Nuclear Engineering and TechnologyThe integration of Buried Power Rail (BPR) and Complementary FET (CFET) technologies is a promising way to improve power efficiency and circuit density in advanced logic devices.
Dongwook Kim +4 more
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A Comprehensive Methodology for Soft Error Rate (SER) Reduction in Clock Distribution Network
ChipsSingle Event Transients (SETs) in clock-distribution networks are a major source of soft errors in synchronous systems. We present a practical framework that assesses SET risk early in the design cycle, before layout and parasitics, using a Vulnerability
Jorge Johanny Saenz-Noval +2 more
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RHLP-18T: A Radiation-Hardened 18T SRAM with Enhanced Read Stability and Low Power Consumption
Applied SciencesElectronic equipment in space is constantly exposed to high-energy particles, which can induce Single Event Upsets (SEUs) in memory components, threatening system reliability.
Han-Gyeol Kim, Sung-Hun Jo
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Atmospheric neutron inducing single event effects on AI chips manufacturing with 8 nm FinFET
Nuclear Engineering and Technology--With the rapid advancement of artificial intelligence (AI) chips in diverse applications, single event effects (SEE) caused by high energy particles in ambient environment have emerged as a critical concern.
Yonghong Li +7 more
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Single Event Upset Study of 22 nm Fully Depleted Silicon-on-Insulator Static Random Access Memory with Charge Sharing Effect. [PDF]
Micromachines (Basel), 2023 Yin C, Gao T, Wei H, Chen Y, Liu H.
europepmc +1 more source
A multi-node-upset-resilient 14T SRAM with high read stability for space applications
Nuclear Engineering and TechnologyThis paper proposes a voltage-booster read-decoupled radiation-hardened 14T (BDRH14T) SRAM cell. In harsh environments such as space, radiation can flip the stored data in memory cells, resulting in soft errors, including single-event upset (SEU) and ...
Sung-Jun Lim, Sung-Hun Jo
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