Results 131 to 140 of about 989 (213)

Design and Analysis of Soft Error Rate in FET/CNTFET Based Radiation Hardened SRAM Cell. [PDF]

open access: yesSensors (Basel), 2021
Muthu BR   +6 more
europepmc   +1 more source

Analysis and Test of the Effects of Single Event Upsets Affecting the Configuration Memory of SRAM-based FPGAs

open access: yes, 2013
SRAM-based FPGAs are increasingly relevant in a growing number of safety-critical application fields, ranging from automotive to aerospace. These application fields are characterized by a harsh radiation environment that can cause the occurrence of ...
CASSANO, LUCA MARIA
core  

A guideline for heavy ion radiation testing for Single Event Upset (SEU)

open access: yes, 1984
A guideline for heavy ion radiation testing for single event upset was prepared to assist new experimenters in preparing and directing tests. How to estimate parts vulnerability and select an irradiation facility is described.
Price, W. E., Nichols, D. K., Malone, C.
core  

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