Results 21 to 30 of about 989 (213)

Determination of the Sensitive Volume and Critical Charge for Induction of SEU in Nanometer SRAMs [PDF]

فصلنامه علوم و فناوری فضایی, 2023
In this paper, the sensitive volume and critical charge of a 65-nm CMOS SRAM as two important quantities in Single Event Upset (SEU) calculations have been determined. SEU is the most common event in space investigations.
Gholamreza Raisali, Masume Soleimaninia, Amir Moslehi   +2 more
doaj   +1 more source

FAUST: fault-injection script-based tool [PDF]

, 2003
The tool described in this paper aims at evaluating the effectiveness of software-implemented fault-tolerant techniques used in safety-critical systems. The target application is stressed with the injection of transient or permanent faults.
Di Natale, Giorgio, Tagliaferri, Luca, Solcia, Ivano, Benso, Alfredo, Prinetto, Paolo Ernesto, Di Carlo, Stefano   +5 more
core   +1 more source

Double Node Upset Immune RHBD-14T SRAM Cell for Space and Satellite Applications

IEEE Access, 2023
Deep sub-micron memory devices play a crucial role in space electronic applications due to their susceptibility to single-event upset and double-node upset types of soft errors. When a charged particle from space hit a scaled memory circuit, the critical
Pavan Kumar Mukku, Rohit Lorenzo
doaj   +1 more source

Radiation Hardened NULL Convention Logic Asynchronous Circuit Design

Journal of Low Power Electronics and Applications, 2015
This paper proposes a radiation hardened NULL Convention Logic (NCL) architecture that can recover from a single event latchup (SEL) or single event upset (SEU) fault without deadlock or any data loss.
Liang Zhou, Scott C. Smith, Jia Di
doaj   +1 more source

Efficient Protection of FPGA Implemented LDPC Decoders Against Single Event Upsets (SEUs) on Configuration Memories

IEEE Transactions on Circuits and Systems I: Regular Papers, 2023
Low Density Parity Check (LDPC) codes are used in 5G systems for traffic channels due to their excellent error correction capability for long sequences, and the Min-Sum algorithm is widely applied in practical implementations of LDPC decoders due to its low complexity.
Zhen Gao 0005, Yinghao Cheng, Qiang Liu 0011, Anees Ullah, Pedro Reviriego   +4 more
openaire   +2 more sources

Energy and angular dependence of single event upsets in ESA SEU Monitor

Acta Physica Sinica, 2016
The new generation ESA SEU Monitor is first applied to beam verification of Beijing HI-13 Tandem accelerator according to the popularization need of Europe Space Agency and at the desire of contrast of domestic acceleraor with international accelerator.
null Luo Yin-Hong, null Guo Xiao-Qiang, null Chen Wei, null Guo Gang, null Fan Hui   +4 more
openaire   +1 more source

Dynamic Partial Reconfiguration Project for the Anti-single Event Effect Based on the Soft Error Mitigation

Nantong Daxue xuebao. Ziran kexue ban, 2020
With the wide application of FPGA(field programmable gate array) based on the SRAM(static randomaccess memory) in the aerospace field, the probability of SEU(single event upset) increases gradually while the FPGAs are exposed in irradiation environment ...
XIE Da;DONG Yiping;WANG Lan;CAO Jinde;GUO Junjie
doaj   +1 more source

Abnormal Signatures Recorded by FORMOSAT-2 and FORMOSAT-3 over South Atlantic Anomaly and Polar Region

Terrestrial, Atmospheric and Oceanic Sciences, 2014
Computer systems onboard FORMOSAT-2 (F2) and FORMOSAT-3/COSMIC (F3/C) satellites often register abnormal signatures which are recorded as automatic reconfiguration orders (ARO) in F2, and reboot/reset (RBS) in F3/C.
Tsung-Ping Lee, Panthalingal Krishnanunni Rajesh, Chao-Yen Chen, Jann-Yenq Liu, Chen-Joe Fong, Jar-Chen Pon, Shan-Kuo Yang, Guey-Shin Chang   +7 more
doaj   +1 more source

Low-Power Radiation-Hardened Static Random Access Memory with Enhanced Read Stability for Space Applications

Applied Sciences
In space environments, radiation particles affect the stored values of SRAM cells, and these effects, such as single-event upsets (SEUs) and single-event multiple-node upsets (SEMNUs), pose a threat to the reliability of systems used in the space ...
Hong-Geun Park, Sung-Hun Jo
doaj   +1 more source

SETTOFF : a fault tolerant flip-flop for building cost-efficient reliable systems [PDF]

, 2012
Conventional fault tolerance techniques either require big overheads or have limited reliability. We propose a novel fault tolerant flip-flop (SETTOFF) that addresses timing errors and soft errors in one cost-efficient architecture. In SETTOFF, most SEUs
Zwolinski, Mark, Yang Lin, Lin, Yang, Mark Zwolinski   +3 more
core   +1 more source