Results 21 to 30 of about 264 (165)

Double Node Upset Immune RHBD-14T SRAM Cell for Space and Satellite Applications

IEEE Access, 2023
Deep sub-micron memory devices play a crucial role in space electronic applications due to their susceptibility to single-event upset and double-node upset types of soft errors. When a charged particle from space hit a scaled memory circuit, the critical
Pavan Kumar Mukku, Rohit Lorenzo
doaj   +1 more source

Radiation Hardened NULL Convention Logic Asynchronous Circuit Design

Journal of Low Power Electronics and Applications, 2015
This paper proposes a radiation hardened NULL Convention Logic (NCL) architecture that can recover from a single event latchup (SEL) or single event upset (SEU) fault without deadlock or any data loss.
Liang Zhou, Scott C. Smith, Jia Di
doaj   +1 more source

Interfacial Fluorinated Ion Crowding Enables Reversible Zinc Metal Batteries

Angewandte Chemie, EarlyView.
Unlike conventional single‐anion electrolytes with limited interfacial regulation, interfacial F‐ion crowding enables dense occupation of the inner Helmholtz plane through cooperative fluorinated anions, thereby generating a fluorine‐rich interface that excludes water, homogenizes Zn2+ nucleation, promotes Zn (100)‐oriented deposition, and enables ...
Xinyu Zhang, Jitao Shang, Ruwei Chen, Jianrui Feng, Hang Yang, Jingyi Wang, Fei Guo, Shuhui Li, Zijuan Du, Peie Jiang, Xiaoxia Guo, Wei Zhang, Jie Chen, Hongzhen He, Xuan Gao, Zhenjing Jiang, Bing Wang, Yuhang Dai, Guanjie He   +18 more
wiley   +2 more sources

Efficient Protection of FPGA Implemented LDPC Decoders Against Single Event Upsets (SEUs) on Configuration Memories

IEEE Transactions on Circuits and Systems I: Regular Papers, 2023
Low Density Parity Check (LDPC) codes are used in 5G systems for traffic channels due to their excellent error correction capability for long sequences, and the Min-Sum algorithm is widely applied in practical implementations of LDPC decoders due to its low complexity.
Zhen Gao 0005, Yinghao Cheng, Qiang Liu 0011, Anees Ullah, Pedro Reviriego   +4 more
openaire   +2 more sources

Energy and angular dependence of single event upsets in ESA SEU Monitor

Acta Physica Sinica, 2016
The new generation ESA SEU Monitor is first applied to beam verification of Beijing HI-13 Tandem accelerator according to the popularization need of Europe Space Agency and at the desire of contrast of domestic acceleraor with international accelerator.
null Luo Yin-Hong, null Guo Xiao-Qiang, null Chen Wei, null Guo Gang, null Fan Hui   +4 more
openaire   +1 more source

Dynamic Partial Reconfiguration Project for the Anti-single Event Effect Based on the Soft Error Mitigation

Nantong Daxue xuebao. Ziran kexue ban, 2020
With the wide application of FPGA(field programmable gate array) based on the SRAM(static randomaccess memory) in the aerospace field, the probability of SEU(single event upset) increases gradually while the FPGAs are exposed in irradiation environment ...
XIE Da;DONG Yiping;WANG Lan;CAO Jinde;GUO Junjie
doaj   +1 more source

Abnormal Signatures Recorded by FORMOSAT-2 and FORMOSAT-3 over South Atlantic Anomaly and Polar Region

Terrestrial, Atmospheric and Oceanic Sciences, 2014
Computer systems onboard FORMOSAT-2 (F2) and FORMOSAT-3/COSMIC (F3/C) satellites often register abnormal signatures which are recorded as automatic reconfiguration orders (ARO) in F2, and reboot/reset (RBS) in F3/C.
Tsung-Ping Lee, Panthalingal Krishnanunni Rajesh, Chao-Yen Chen, Jann-Yenq Liu, Chen-Joe Fong, Jar-Chen Pon, Shan-Kuo Yang, Guey-Shin Chang   +7 more
doaj   +1 more source

Low-Power Radiation-Hardened Static Random Access Memory with Enhanced Read Stability for Space Applications

Applied Sciences
In space environments, radiation particles affect the stored values of SRAM cells, and these effects, such as single-event upsets (SEUs) and single-event multiple-node upsets (SEMNUs), pose a threat to the reliability of systems used in the space ...
Hong-Geun Park, Sung-Hun Jo
doaj   +1 more source

NI Based System for Seu Testing of Memory Chips for Avionics

MATEC Web of Conferences, 2016
This paper presents the results of implementation of National Instrument based system for Single Event Upset testing of memory chips into neutron generator experimental facility, which used for SEU tests for avionics purposes. Basic SEU testing algorithm
Boruzdina Anna, Yanenko Andrey, Tikhomirov Georgy, Tumanov Vitaly   +3 more
doaj   +1 more source

Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

Nuclear Engineering and Technology, 2017
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems.
T.S. Nidhin, Anindya Bhattacharyya, R.P. Behera, T. Jayanthi, K. Velusamy   +4 more
doaj   +1 more source