Results 31 to 40 of about 989 (213)

Understanding radiation effects in SRAM-based field programmable gate arrays for implementing instrumentation and control systems of nuclear power plants

Nuclear Engineering and Technology, 2017
Field programmable gate arrays (FPGAs) are getting more attention in safety-related and safety-critical application development of nuclear power plant instrumentation and control systems.
T.S. Nidhin, Anindya Bhattacharyya, R.P. Behera, T. Jayanthi, K. Velusamy   +4 more
doaj   +1 more source

Dynamic Partial based Single Event Upset (SEU) Injection Platform on FPGA

International Journal of Computer Applications, 2013
SRAM based FPGAs are attracting considerable interest especially in aerospace applications due to their high reconfigurability, low cost and availability. However, these devices are strongly susceptible to space radiation effects which are able to cause unwanted single event upsets (SEUs) in the configuration memory.
Karim Mohammadi, Reza OmidiGosheblagh
openaire   +1 more source

NI Based System for Seu Testing of Memory Chips for Avionics

MATEC Web of Conferences, 2016
This paper presents the results of implementation of National Instrument based system for Single Event Upset testing of memory chips into neutron generator experimental facility, which used for SEU tests for avionics purposes. Basic SEU testing algorithm
Boruzdina Anna, Yanenko Andrey, Tikhomirov Georgy, Tumanov Vitaly   +3 more
doaj   +1 more source

Mitigating bit flips or single event upsets in epilepsy neurostimulators

Epilepsy and Behavior Case Reports, 2016
Objectives: The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators. Materials and methods: A case report of a single event upset or bit flip is discussed;
Alice X. Dong, Ryder P. Gwinn, Nicole M. Warner, Lisa M. Caylor, Michael J. Doherty   +4 more
doaj   +1 more source

A computational analysis on the role of low energy proton-induced single event upset in a 65 nm CMOS SRAM [PDF]

مجله علوم و فنون هسته‌ای, 2020
This investigation is a computational analysis of a kind of radiation effect on electronic devices, known as the single event upset (SEU) with the Geant4 toolkit.
M. Soleimaninia,, G. Raisali, A. Moslehi
doaj   +1 more source

Large‐Scale Evaluation of Traditional Chinese Medicines Reveals Potential PPARγ Modulators for Type 2 Diabetes Management

Journal of Clinical Laboratory Analysis, EarlyView.
Identifying novel treatments for diabetic management is always a competitive research topic all over the world. PPAR‐γ is one of the key regulators involved in glucose and lipid metabolism and improves insulin sensitivity and glucose homeostasis. This study investigated the impacts of 639 traditional Chinese medicine (TCM) on PPAR‐γ gene promoter ...
Mingyuan Dou, Shandra Jones, Juan Montes, Jonathan Ritter, Li‐Yu Shih, Chia‐Jung Chan, Ying‐Chou Lin, Min Chen, Shih‐Yin Chen, Ning Wu   +9 more
wiley   +1 more source

Individual movement modeling expands the power of migratory species observations: North Atlantic right whale case study

Limnology and Oceanography: Methods, EarlyView.
Abstract Understanding a population's distribution depends on observing the presence and movement of individuals throughout their range. For highly mobile marine species, these observations typically rely on high effort monitoring programs. Tracking enough individuals to understand trends in movement behavior is not always logistically feasible, and ...
Abigail M. Kreuser, Daniel E. Pendleton, Nicholas R. Record, Erin L. Meyer‐Gutbrod   +3 more
wiley   +1 more source

Predication of Heavy Ion Single Event Upset Threshold and Cross Section Based on Low Energy Proton Test Data in Nanometer Devices

Yuanzineng kexue jishu
In order to ensure the reliability of heavy ion single event effect experimental data and the accuracy of space on-orbit single event error rate prediction, the research was conducted on the method of predicting the equivalent silicon layer thickness ...
LUO Yinhong, ZHANG Fengqi, WANG Tan, DING Lili, JIANG Xinshuai
doaj   +1 more source

What turns us off about green and blue spaces in cities? Understanding perceived problems and unpleasant experiences for more just urban planning, design and management

People and Nature, EarlyView.
Abstract The planning, design and management of urban green and blue spaces necessitate trade‐offs between these spaces' many benefits and their drawbacks, but knowledge of perceived problems and unpleasant experiences in urban green and blue spaces remains limited.
Alyssa L. Solvie, Oriol García‐Antúnez, Elizabeth M. Cook, Natalie M. Gulsrud, Anton Stahl Olafsson, Megan Maurer   +5 more
wiley   +1 more source

Técnicas de inyección de fallos basadas en FPGAs para la evaluación de la tolerancia a fallos de tipo SEU en circuitos digitales [PDF]

, 2007
Este trabajo de tesis doctoral presenta nuevas técnicas de inyección de fallos transitorios en elementos de memoria, que permiten la evaluación del comportamiento de los complejos circuitos digitales actuales en presencia de fallos SEU (Single Event ...
Portela García, Marta
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