Results 31 to 40 of about 8,001,430 (204)

Mitigating bit flips or single event upsets in epilepsy neurostimulators

Epilepsy and Behavior Case Reports, 2016
Objectives: The objective of this study was to review software errors known as single event upsets (SEUs) or bit flips due to cosmic rays in epilepsy neurostimulators. Materials and methods: A case report of a single event upset or bit flip is discussed;
Alice X. Dong, Ryder P. Gwinn, Nicole M. Warner, Lisa M. Caylor, Michael J. Doherty   +4 more
doaj   +1 more source

A computational analysis on the role of low energy proton-induced single event upset in a 65 nm CMOS SRAM [PDF]

مجله علوم و فنون هسته‌ای, 2020
This investigation is a computational analysis of a kind of radiation effect on electronic devices, known as the single event upset (SEU) with the Geant4 toolkit.
M. Soleimaninia,, G. Raisali, A. Moslehi
doaj   +1 more source

Dynamic Partial based Single Event Upset (SEU) Injection Platform on FPGA

International Journal of Computer Applications, 2013
SRAM based FPGAs are attracting considerable interest especially in aerospace applications due to their high reconfigurability, low cost and availability. However, these devices are strongly susceptible to space radiation effects which are able to cause unwanted single event upsets (SEUs) in the configuration memory.
Karim Mohammadi, Reza OmidiGosheblagh
openaire   +1 more source

Robotics in Ionizing Radiation Environments: Vulnerabilities, Hardening, and Future Directions

Advanced Robotics Research, EarlyView.
Radiation exposure causes cumulative degradation in robotic sensors, actuators, and electronic logic, often leading to undetected failures. This study maps component vulnerabilities, evaluates hardening and shielding strategies, and identifies testing gaps that must be addressed to enable next‐generation radiation‐tolerant robotic systems.
Francis A. K. Djirackor, Josephine T. Djirackor, Amanuel Abrdo Tereda, Sun Yi, Younho Seong   +4 more
wiley   +1 more source

Analyzing Test-As-You-Fly Single Event Upset (SEU) Responses using SEU Data, Classical Reliability Models, and Space Environment Data [PDF]

, 2017
We propose a method for the application of single event upset (SEU) data towards the analysis of complex systems using transformed reliability models (from the time domain to the particle fluence domain) and space environment ...
Campola, Michael, Berg, Melanie, Xapsos, Michael, Label, Kenneth   +3 more
core  

Glutaminolysis Blockade‐Empowered Bimodal Nanodepot for Spatially Complementary Sono‐Thermal Ablation via PANoptosis and STING Activation Against Large Tumors

Advanced Science, EarlyView.
An injectable bimodal TCPD nanodepot disrupts glutaminolysis and TCA metabolism, sensitizing large tumors to spatially complementary sono‐thermal ablation for complete treatment coverage. This intervention induces mitochondrial and endoplasmic reticulum dysfunction, genotoxicity, and NAD+ depletion, converging to trigger PANoptosome assembly and ...
Yi‐Ming Liu, Juan Qin, Si‐Yuan Wu, Xue‐Zhen Zhu, Yun‐Fei Cai, Pei‐Yao Sun, Hao Yang, Xing‐Yue Wang, Shu Li, Duo Wang, Hai‐Dong Zhu   +10 more
wiley   +1 more source

Single-event-upset-like fault injection: a comprehensive framework

, 2005
INTERNATIONAL STANDARD SERIAL NUMBERS (Translation and Original): 0018-9499International audienceAn approach to reproduce radiation ground testing results for the study of microprocessors vulnerability to single event upset (SEU) is described in this ...
Faure, F., Velazco, Raoul, Peronnard, P.
core   +1 more source

Predication of Heavy Ion Single Event Upset Threshold and Cross Section Based on Low Energy Proton Test Data in Nanometer Devices

Yuanzineng kexue jishu
In order to ensure the reliability of heavy ion single event effect experimental data and the accuracy of space on-orbit single event error rate prediction, the research was conducted on the method of predicting the equivalent silicon layer thickness ...
LUO Yinhong, ZHANG Fengqi, WANG Tan, DING Lili, JIANG Xinshuai
doaj   +1 more source

The Impact of Soft Error on C-Elements Due to Process Corner Variation and Temperature

Journal of Applied Science & Process Engineering, 2015
This paper presents current injection resemble single event upset (SEU) current at the vulnerable nodes on different configurations of C-elements under two different scenarios: process corner and temperature. The objectives are to identify the vulnerable
Norhuzaimin Julai
doaj   +1 more source

Fabrication of Composite Cathode for All‐Solid‐State Sodium Batteries

Advanced Energy Materials, EarlyView.
The design of composite cathodes for all‐solid‐state sodium batteries must address three critical challenges—interfacial side reactions, interfacial delamination, and highly tortuous transport pathways. This work outlines structural and interfacial strategies to optimize ion transport and mechanical stability, enabling durable, and high‐performance ...
Gaoming Sun, Yuan Ma, Hehe Zhang, Shengan Wu, Shiyong Chu, Stefano Passerini, Yanjiao Ma   +6 more
wiley   +1 more source