Results 151 to 160 of about 253 (176)
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2008
This research faces the problem of disturbance induced by high energy particles on electronic devices. Based on detailed analysis of this phenomenon, the work is divided into two parts: in the first part testing of the Single Event Upset (SEU) has been carried out with the aim of determining diagnostic techniques and the mitigation of this disturbance,
CIANI, LORENZO +2 more
openaire +1 more source
This research faces the problem of disturbance induced by high energy particles on electronic devices. Based on detailed analysis of this phenomenon, the work is divided into two parts: in the first part testing of the Single Event Upset (SEU) has been carried out with the aim of determining diagnostic techniques and the mitigation of this disturbance,
CIANI, LORENZO +2 more
openaire +1 more source
2021 IEEE International Conference on Wireless for Space and Extreme Environments (WiSEE), 2021
Kirolosse M. Girgis +2 more
openaire +1 more source
Kirolosse M. Girgis +2 more
openaire +1 more source
2022 Iranian International Conference on Microelectronics (IICM), 2022
Masume Soleimaninia +2 more
openaire +1 more source
Masume Soleimaninia +2 more
openaire +1 more source
Heavy Ion and Proton-Induced Single Event Upset Characteristics of a 3-D NAND Flash Memory
IEEE Transactions on Nuclear Science, 2018Dakai Chen +2 more
exaly
Low Energy Proton Single-Event-Upset Test Results on 65 nm SOI SRAM
IEEE Transactions on Nuclear Science, 2008Kenneth A Label
exaly
Double-Node-Upset-Resilient Latch Design for Nanoscale CMOS Technology
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017Aibin Yan, Maoxiang Yi, Huaguo Liang
exaly