Results 21 to 30 of about 217,499 (262)
Soft Error Resilient System Design through Error Correction [PDF]
2006 IFIP International Conference on Very Large Scale Integration, 2006 This paper presents an overview of the Built-In Soft Error Resilience (BISER) technique for correcting soft errors in latches, flip-flops and combinational logic. The BISER technique enables more than an order of magnitude reduction in chip-level error soft rate with minimal area impact, 6-10% chip-level power impact, and 1-5% performance impact ...
Subhasish Mitra +4 more
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Identify Silent Data Corruption Vulnerable Instructions Using SVM
IEEE Access, 2019 Silent data corruption (SDC) is the most insidious and harmful result type of soft error. Identify program vulnerable instructions (PVIns) that are likely to cause SDCs is extremely significant on selective software-based protection techniques.
Na Yang, Yun Wang
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A Methodology to Assess Output Vulnerability Factors for Detecting Silent Data Corruption
IEEE Access, 2019 As process technology scales, electronic devices become more susceptible to soft error induced by radiation. Silent data corruption (SDC) is considered the most severe outcome incurred by soft error.
Junchi Ma, Zongtao Duan, Lei Tang
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CRC-Aided Fixed Complexity Error Pattern Estimation Technique
IEEE Access, 2022 Various techniques using cyclic redundancy check (CRC) codes for error correction have been proposed. In previous techniques, a small number of unreliable bits in a packet were toggled in order to change negative acknowledgement (NAK) into ...
Juhee Yun, Nulibyul Kim, Jaekwon Kim
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A Cell Sizing Technique for Mitigating Logic Soft Errors in Gate-level Designs
Advances in Electrical and Computer Engineering, 2013 The effect of logic soft errors on the degradation of the reliability becomes more crucial in the case of nano-meter semiconductor designs. Several hardening techniques have been reported from the transistor- to system-level.
KIM, J. T., PARK, J. K.
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Optimized Multiple-Bit-Flip Soft-Errors-Tolerant TCAM using Machine Learning
Jurnal Nasional Teknik Elektro, 2022 Soft errors from radiations can change the data in electronic devices especially memory cells such as in TCAMs. The soft errors cause bit-flip errors that makes the data are corrupted in the network.
Infall Syafalni, Trio Adiono
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MicromachinesWith the rapid development of semiconductor technology, the reduction in device operating voltage and threshold voltage has made integrated circuits more susceptible to the effects of particle radiation. Moreover, as process sizes decrease, the impact of
Rui Dong +6 more
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IEEE Access, 2019 This paper presents two novel quadruple cross-coupled memory cell designs, namely QCCM10T and QCCM12T, with protection against single event upsets (SEUs) and double-node upsets (DNUs).
Aibin Yan +6 more
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Molecular Oncology, EarlyView.Combining PTEN protein assessment and transcriptomic profiling of prostate tumors, we uncovered a network enriched in senescence and extracellular matrix (ECM) programs associated with PTEN loss and conserved in a mouse model. We show that PTEN‐deficient cells trigger paracrine remodeling of the surrounding stroma and this information could help ...
Ivana Rondon‐Lorefice +16 more
wiley +1 more source
Optical Multi-Context Blind Scrubbing for Field Programmable Gate Arrays
IEEE Photonics Journal, 2020 This paper presents aproposal of a new optical multi-context blind scrubbing that can not only increase the soft-error tolerance of the configuration memory of field programmable gate arrays (FPGAs) but also support high-speed dynamic reconfiguration ...
Yusuke Takaki, Minoru Watanabe
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