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Soft Error Mitigation in Switch Modules of SRAM-based FPGAs
2007 IEEE International Symposium on Circuits and Systems (ISCAS), 2007In this paper, we propose two techniques to mitigate soft error effects on the switch modules of SRAM-based FPGAs: 1) The first technique tolerates SEU-caused open errors based on a new programming method for SRAM-bits of switch modules, and 2) The second technique mitigates SEU-cause short errors in the switch modules based on a mixed programmable and
Zarandi, H. +3 more
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RAT: A Lightweight System-level Soft Error Mitigation Technique
2020 IFIP/IEEE 28th International Conference on Very Large Scale Integration (VLSI-SOC), 2020To achieve a substantial reliability and safety level, it is imperative to provide electronic computing systems with appropriate mechanisms to tackle soft errors. This paper proposes a low-cost system-level soft error mitigation technique, which allocates the critical application function to a pool of specific general-purpose processor registers.
Jonas Gava +2 more
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ISO26262-compliant soft-error mitigation in register banks
2017 22nd IEEE European Test Symposium (ETS), 2017Temporary malfunction of ICs is often caused by Single Event Upsets (SEUs). That is why the automotive safety standard ISO 26262 demands measures to detect and mitigate a certain percentage of safety-critical SEUs. Different kinds of modules require different kinds of safety mechanisms. A frequently used module type is the Register Bank, which provides
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Soft-Error Tolerance and Mitigation in Asynchronous Burst-Mode Circuits
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2009We discuss the problem of soft errors in asynchronous burst-mode machines (ABMMs), and we propose two solutions. The first solution is an error tolerance approach, which leverages the inherent functionality of Muller C-elements, along with a variant of duplication, to suppress all transient errors.
Sobeeh Almukhaizim +3 more
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Experiences with software-based soft-error mitigation using AN codes
Software Quality Journal, 2014Arithmetic error coding schemes are a well-known and effective technique for soft-error mitigation. Although the underlying coding theory is generally a complex area of mathematics, its practical implementation is comparatively simple in general. However, compliance with the theory can be lost easily while moving toward an actual implementation, which ...
Martin Hoffmann 0001 +5 more
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Soft Error Mitigation on Dual Rail Latch
Applied Mechanics and Materials, 2016A single event upset (SEU) or soft error is defined as a temporary error on digital electronics due to the effect of radiation. Such an error can cause system failure, e.g. a deadlock in an asynchronous system or production of incorrect outputs due to data corruption.
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Temporal redundancy latch-based architecture for soft error mitigation
2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS), 2017Current transients caused by energetic particle strikes are a serious threat for digital circuits in aerospace applications. Such single-event transients (SETs) can corrupt the circuit state, with possibly devastating consequences. Although it is possible to protect circuits with spatial redundancy techniques, the area and power overhead is high ...
Robert Schmidt 0003 +2 more
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Soft-error mitigation by means of decoupled transactional memory threads
Distributed Computing, 2014CMOS scaling exacerbates hardware errors making reliability a big concern for recent and future microarchitecture designs. Mechanisms to provide fault tolerance in architectures must accomplish several objectives such as low performance degradation, power consumption and area overhead.
Daniel Sánchez 0004 +3 more
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Framework for Selective Flip-Flop Replacement for Soft Error Mitigation
2015 28th International Conference on VLSI Design, 2015With increasing adoption of newer technologies and architectures targeted for automotive and aviation electronics with an objective to improve performance and/or reduce power/area, soft-error robustness is becoming an important issue to ensure reliable operation for an extended lifetime over a wide range of operating conditions.
Pavan Vithal Torvi +2 more
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In-place LUT polarity inVersion to mitigate soft errors for FPGAs
2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2016In-place Polarity inVersion (IPV) has been proposed to mitigate the single event upset (SEU) induced soft errors for academic VPR FPGA architectures, and this paper extends the original IPV so that it can be used for commercial FPGA architectures. Different from the original IPV, we use a new soft error model based on signal probability and propose a ...
Juexiao Su +3 more
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