Results 21 to 30 of about 1,965 (222)

Investigation of Radiation Hardened TFET SRAM Cell for Mitigation of Single Event Upset

open access: yesIEEE Journal of the Electron Devices Society, 2020
This study analyzes the soft error sensitivity of SRAM cell which employs double-gate tunnel field effect transistor (DG TFET). The mitigation technique for the data recovery after the heavy ion strike is discussed.
M. Pown, B. Lakshmi
doaj   +1 more source

TFET-Based Op-amp Design for Computational Circuits [PDF]

open access: yes, 2021
Tunnel field effect transistor (TFET) is rapidly replacing MOSFETs in low power designs and applications. This is due to high leakage power that engendered from scaling down CMOS transistors.
Naheem Olakunle Adesina   +5 more
core   +1 more source

Drain current model for a hetero‐dielectric single gate tunnel field effect transistor ( HDSG TFET ) [PDF]

open access: yes, 2022
Tunnel field effect transistor (TFET) is a potential candidate to replace CMOS in deep-submicron region due to its lower SS (subthreshold swing,
Singh, Ajay Kumar   +2 more
core   +1 more source

Fabrication and Electrical Characteristics of ZnSnO/Si Bilayer Tunneling Filed-Effect Transistors

open access: yesIEEE Journal of the Electron Devices Society, 2019
We demonstrate improvement of electrical characteristics of a bilayer tunneling field effect transistor (TFET) composed of an n-type zinc-tin-oxide (ZnSnO) channel with superior thickness uniformity and a p-type Si source.
Kimihiko Kato   +4 more
doaj   +1 more source

Simulation Study of the Double-Gate Tunnel Field-Effect Transistor with Step Channel Thickness

open access: yesNanoscale Research Letters, 2020
Double-gate tunnel field-effect transistor (DG TFET) is expected to extend the limitations of leakage current and subthreshold slope. However, it also suffers from the ambipolar behavior with the symmetrical source/drain architecture.
Maolin Zhang   +4 more
doaj   +1 more source

Analytical model and simulation‐based analysis of a work function engineered triple metal tunnel field‐effect transistor device showing excellent device performance

open access: yesIET Circuits, Devices and Systems, 2021
In this study, the authors propose a work function engineered (WFE) triple metal (TM) tunnel field‐effect transistor (TFET) device, which exhibits lower subthreshold slope (SS) and better on to off current ratio in comparison with conventional double ...
Ria Bose, Jatindra Nath Roy
doaj   +1 more source

Performance Analysis of Double Material Gate (DG) -TFET with Channel Doping [PDF]

open access: yes, 2022
Double Material Gate (DG) Tunnel Field Effect Transistor (TFET) is proposed in this paper with current semiconductor materials analogous to Silicon dioxide (Sio2) and Hafnium Oxide (Hfo2) in 5 nm regime with symmetrical Gate to resolve the challenges ...
V, Raju   +6 more
core   +1 more source

In-Line Tunnel Field Effect Transistor: Drive Current Improvement

open access: yesIEEE Journal of the Electron Devices Society, 2018
A new architecture of tunnel field effect transistor (TFET) with in-line (vertical) tunneling area is introduced. By adding the vertical tunneling area, the in-line TFET architecture outperformed the normal TFET in terms of the drive current, the ...
Woojin Park   +3 more
doaj   +1 more source

A Novel Dopingless Fin-Shaped SiGe Channel TFET with Improved Performance

open access: yesNanoscale Research Letters, 2020
In this paper, a dopingless fin-shaped SiGe channel TFET (DF-TFET) is proposed and studied. To form a high-efficiency dopingless line tunneling junction, a fin-shaped SiGe channel and a gate/source overlap are induced.
Shupeng Chen   +5 more
doaj   +1 more source

Modelling and simulation of Heteromaterial Dual-Gate Dopingless TFET (HTDGDL-TFET) and its application as digital inverter [PDF]

open access: yes, 2022
Tunnel Field -Effect Transistor (TFET) has been known as one of the promising devices which will be replacing Conventional Metal Oxide Semiconductor Field-Effect Transistor (MOSFET) as a future low-power and high-speed logic application.
Teoh, Wei Ting
core  

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