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Total Ionizing Dose (TID) and Displacement Damage (DD) Effects in Integrated Circuits: Recent Results and the Implications for Emerging Technology

open access: yesTotal Ionizing Dose (TID) and Displacement Damage (DD) Effects in Integrated Circuits: Recent Results and the Implications for Emerging Technology
Over the last 50 years, the effects of cumulative radiation damage in microelectronics, and now nanoelectronics, have continually presented a design and assurance challenge to space flight missions. Feature sizes, that is, the size of the unit structure in microelectronics, has continually decreased, which has presented an added complexity to testing ...
openaire  

A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability. [PDF]

open access: yesMaterials (Basel)
Feng Z   +7 more
europepmc   +1 more source

Large-scale complementary carbon nanotube integrated circuits for harsh radiation environments. [PDF]

open access: yesSci Adv
Zhang K   +11 more
europepmc   +1 more source

Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation. [PDF]

open access: yesMaterials (Basel)
Ortiz Sánchez C   +5 more
europepmc   +1 more source

Characterization of an Ultra-Thin Silicon Strain Gauge Exposed to Gamma Ray Irradiation. [PDF]

open access: yesSensors (Basel)
Yang F   +10 more
europepmc   +1 more source

Therapeutic mechanisms of Lycii Fructus in male infertility: a comprehensive review. [PDF]

open access: yesFront Pharmacol
Ma D   +9 more
europepmc   +1 more source

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