Over the last 50 years, the effects of cumulative radiation damage in microelectronics, and now nanoelectronics, have continually presented a design and assurance challenge to space flight missions. Feature sizes, that is, the size of the unit structure in microelectronics, has continually decreased, which has presented an added complexity to testing ...
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Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices. [PDF]
Ren Y, Zhu M, Dai X, Li L, Liu M.
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A New Simulation Method to Assess Temperature and Radiation Effects on SiC Resonant-Converter Reliability. [PDF]
Feng Z +7 more
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Review of Passive Shielding Materials for High-Energy Charged Particles in Earth's Orbit. [PDF]
Wang M +6 more
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Comparative study of pathology of various organs of rhesus macaques exposed to two different doses of acute total-body radiation. [PDF]
Brink MW +7 more
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Large-scale complementary carbon nanotube integrated circuits for harsh radiation environments. [PDF]
Zhang K +11 more
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Characterization of Novel Composite Materials with Radiation Shielding Properties for Electronic Encapsulation. [PDF]
Ortiz Sánchez C +5 more
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SPICE Model for SiC Bipolar Transistor and TTL Inverter Degradation Due to Gamma Radiation. [PDF]
Metreveli A, Hallén A, Zetterling CM.
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Characterization of an Ultra-Thin Silicon Strain Gauge Exposed to Gamma Ray Irradiation. [PDF]
Yang F +10 more
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Therapeutic mechanisms of Lycii Fructus in male infertility: a comprehensive review. [PDF]
Ma D +9 more
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