Results 81 to 90 of about 554 (150)

Design and analysis of NC-FinFET using Pb(Zr_yTi_1-y)O₃ under high ionising radiations. [PDF]

Sci Rep
Tripathi SL, Prakash NN, Yadav AK, Raj B, Wijayanto I.   +4 more
europepmc   +1 more source

Gamma Radiation Effects in Amorphous and Crystalline Polyaryletherketones. [PDF]

Polym Sci Technol
Swan SR.
europepmc   +1 more source

Learned adaptive properties for mitigation of weight perturbations in embedded spiking networks. [PDF]

Front Neurosci
Luca S, Xiao TP, Chance FS, Agarwal S, Teeter C, Chapman GW.   +5 more
europepmc   +1 more source

Laser-driven proton sources for efficient radiation testing. [PDF]

Sci Rep
D'Orsi B, Altomare C, Ampollini A, Astorino MD, Bazzano G, Catrix E, Cemmi A, Colangeli A, Di Sarcina I, Lazzaro DS, Lelièvre R, Loreti S, Fourmaux S, Fuchs J, Nenzi P, Pagano G, Panza F, Ronsivalle C, Scifo J, Vallières S, Antici P.   +20 more
europepmc   +1 more source

Boosting carbon nanotube transistors through γ-ray irradiation. [PDF]

Nat Commun
Zhang K, Gao N, Zhang J, Li Y, Zhao J, Zhou D, Wang X, Liu P, Lin X, Xu H, Peng LM, Zhao W.   +11 more
europepmc   +1 more source

Insight into the effects of gamma radiation on MLCCs: from in situ capacitance experiments to physical mechanisms. [PDF]

Nat Commun
Yang P, Zheng T, Ding Y, Pan Y, Yang Y, Lu B, Huang Y, Shi Y, Zhang Y, Li F, Wu H, Wu J, Zhou Q, Zhong L, Meng D, Zeng C.   +15 more
europepmc   +1 more source

Investigation of the Combined Effect of Total Ionizing Dose and Time-Dependent Dielectric Breakdown on PDSOI Devices. [PDF]

Micromachines (Basel), 2022
Yang J, Liu H, Yang K.
europepmc   +1 more source

Total Ionizing Dose (TID) and Displacement Damage (DD) Effects in Integrated Circuits: Recent Results and the Implications for Emerging Technology

Total Ionizing Dose (TID) and Displacement Damage (DD) Effects in Integrated Circuits: Recent Results and the Implications for Emerging Technology
Over the last 50 years, the effects of cumulative radiation damage in microelectronics, and now nanoelectronics, have continually presented a design and assurance challenge to space flight missions. Feature sizes, that is, the size of the unit structure in microelectronics, has continually decreased, which has presented an added complexity to testing ...
openaire  

Total Ionizing Dose Effect Simulation Modeling and Analysis for a DCAP Power Chip. [PDF]

Micromachines (Basel)
Liao X, Lei D, Fu Y, Liu Y, Huang K, Wei Y, Zuo Y, Ying Y, Liu Y, Xu C, Yang Y.   +10 more
europepmc   +1 more source

Overview of the Properties and Formation Process of Interface Traps in MOS and Linear Bipolar Devices. [PDF]

Micromachines (Basel)
Ren Y, Zhu M, Dai X, Li L, Liu M.
europepmc   +1 more source