Results 11 to 20 of about 12,217,467 (150)

Ising Solver Using Vertical NAND Flash Memory

open access: yesAdvanced Intelligent Systems
Combinatorial optimization problems are notoriously hard for conventional computers to solve efficiently. While quantum and analog hardware have been explored to tackle these problems, they often face challenges such as high power use, complexity, or ...
Sung‐Ho Park   +7 more
doaj   +2 more sources

Two-Dimensional Flash Memory: Materials, Interfaces, and Storage-Computing Convergence. [PDF]

open access: yesAdv Sci (Weinh)
We systematically summarize recent advances in 2D flash memory, highlighting how interface and material engineering can overcome the conventional trade‐offs among speed, power consumption, and reliability in silicon‐based flash, and outlining its potential for high‐performance memory and in‐memory computing applications.
Wang Z   +10 more
europepmc   +2 more sources

Light-Absorbing-Layer-Free Flash Lamp Annealing for High-Throughput Fabrication of All-Solution-Processed Oxide Electronics. [PDF]

open access: yesAdv Sci (Weinh)
A flash lamp annealing strategy using a mullite chuck enables rapid conversion of sol–gels to metal oxides on silicon and ultra‐thin glass without extra light‐absorbing layers. Direct light absorption initiates the transformation, and the low thermal conductivity of mullite promotes heat accumulation.
Li Z   +5 more
europepmc   +2 more sources

Re-Thinking Electronic Circuit Design Through Emerging Reconfigurable Field Effect Transistors. [PDF]

open access: yesAdv Sci (Weinh)
Graphical illustration of reconfigurable field effect transistor (RFET) operation modes, including n‐type, p‐type, and ambipolar transport, as well as their areas of application discussed in this review: digital circuit design, analog circuit design, post‐Shannon computing, and sensing. ABSTRACT Reconfigurable field‐effect transistors, short RFETs, are
Trommer J   +19 more
europepmc   +2 more sources

Controlling the Carrier Injection Efficiency in 3D Nanocrystalline Silicon Floating Gate Memory by Novel Design of Control Layer

open access: yesNanomaterials, 2023
Three-dimensional NAND flash memory with high carrier injection efficiency has been of great interest to computing in memory for its stronger capability to deal with big data than that of conventional von Neumann architecture.
Hongsheng Hu   +8 more
doaj   +1 more source

Effect of Noncircular Channel on Distribution of Threshold Voltage in 3D NAND Flash Memory

open access: yesMicromachines, 2023
The instability in threshold voltage (VTH) and charge distributions in noncircular cells of three-dimensional (3D) NAND flash memory are investigated.
Donghyun Go   +6 more
doaj   +1 more source

Adaptive Pulse Programming Scheme for Improving the Vth Distribution and Program Performance in 3D NAND Flash Memory

open access: yesIEEE Journal of the Electron Devices Society, 2021
For triple-level or quad-level 3D NAND flash memory, narrowing the Vth distribution of each state without influencing page program performance is one of the challenges.
Zhichao Du   +6 more
doaj   +1 more source

A Unified Flash Memory Platform for Mode-Adaptive and Robust AI Computation. [PDF]

open access: yesAdv Sci (Weinh)
A unified AND‐type flash memory platform enables both transistor‐mode and capacitor‐mode computing‐in‐memory operations within the same device structure. By selectively switching the sensing mode through peripheral reconfiguration, the platform provides adaptable trade‐offs between computational accuracy, robustness, and energy efficiency for AI ...
Yu D   +6 more
europepmc   +2 more sources

Adaptive Bitline Voltage Countermeasure for Neighbor Wordline Interference in 3D NAND Flash Memory-Based Sensors

open access: yesSensors, 2023
Three-dimensional NAND flash memory is widely used in sensor systems as an advanced storage medium that ensures system stability through fast data access. However, in flash memory, as the number of cell bits increases and the process pitch keeps scaling,
Hanshui Fan   +6 more
doaj   +1 more source

Single Event Effects in 3D NAND Flash Memory Cells with Replacement Gate Technology [PDF]

open access: yes, 2022
We studied the heavy-ion single event effect response of 3D NAND Flash memory cells with charge-trap based replacement gate technology. Error cross sections, threshold voltage shifts, and underlying mechanisms are discussed.
Gerardin S.   +6 more
core   +1 more source

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