Results 1 to 10 of about 8,846,054 (209)

Modeling methodology for thermo-structural analysis of V-NAND flash memory structure [PDF]

open access: yesScientific Reports
This study proposes modeling methodology based on a continuous model for conducting thermo-electric-structural analyses of V-NAND flash memory structure under the Joule heating effect.
Yongha Kim, Seungjun Ryu, Sungryung Lee
doaj   +5 more sources

Numerical Study on the Laser Annealing of Silicon Used in Advanced V-NAND Device. [PDF]

open access: yesMaterials (Basel), 2022
Laser melt annealing of amorphous silicon (a-Si) and subsequent recrystallization of a-Si are essential processes for successfully implementing vertical NAND (V-NAND) flash memory devices developed based on the cell-over-periphery (COP) structure. The aim of this study was to develop the numerical model for the laser melting process of a-Si used in V ...
Son YI, Shin J.
europepmc   +4 more sources

Simulation Acceleration of Bit Error Rate Prediction and Yield Optimization of 3D V-NAND Flash Memory

open access: yesIEEE Access, 2023
When designing 3D V-NAND technologies with a gate induced drain leakage (GIDL) assisted erase scheme, many experiments must be conducted to determine the optimal GIDL design targets to achieve fast erase performance and secure yield characteristics ...
Yohan Kim, Soyoung Kim
doaj   +3 more sources

What Will Come After V‐NAND—Vertical Resistive Switching Memory? [PDF]

open access: yesAdvanced Electronic Materials, 2019
AbstractThe NAND flash memory serves as the key enabler of the flourishing of portable handheld information devices, such as the cellular phone. The recent upsurge in the sales of vertical NAND flash memory (V‐NAND) entails a further increase in the available information capacity at the edge devices and the servers with higher performance and lower ...
Kyung Jean Yoon   +2 more
semanticscholar   +4 more sources

Dynamic pass bias control for temperature-resilient neural networks using vertical NAND flash memory [PDF]

open access: yesNano Convergence
Vertical NAND (V-NAND) flash memory has emerged as a promising candidate for neuromorphic computing platforms due to its high density, scalability, and reliability.
Sung-Ho Park   +11 more
doaj   +3 more sources

Retention Characteristics and DMP Efficiency in V-NAND With Dimple Structure

open access: yesIEEE Journal of the Electron Devices Society
In this paper, we analyze the retention characteristics of vertical NAND(V-NAND) with dimpled (convex and concave) structures considering the impact of adjacent cell states.
Seongwoo Kim   +3 more
doaj   +3 more sources

Concealable physical unclonable functions using vertical NAND flash memory [PDF]

open access: yesNature Communications
Physical Unclonable Functions (PUFs) can address the demand for enhanced hardware security. Vertical NAND (V-NAND) flash memory is the most commercialized non-volatile memory.
Sung-Ho Park   +5 more
doaj   +3 more sources

Machine Learning Based Optimization Technique for High-Capacity V-NAND Flash Memory [PDF]

open access: yesInternational Symposium for Testing and Failure Analysis, 2021
Abstract In the NAND flash manufacturing process, thousands of internal electronic fuses (eFuse) are tuned in order to optimize performance and validity. In this paper, we propose a machine learning optimization technique that uses deep learning (DL) and genetic algorithms (GA) to automatically tune eFuse values.
Jisuk Kim   +14 more
openaire   +2 more sources

Controlling the beam angle spread of carbon implantation for improvement of bin map defect in V-NAND flash memory

open access: yesMemories - Materials, Devices, Circuits and Systems, 2023
As the shrinkage of devices accelerates and the vertical layers increase, beam angle spread of carbon ion implantation (C IIP) for the silicon selective epitaxial growth (Si-SEG) areas in V-NAND is one of the most critical parameters related with bin map defects.
Gui-Fu Yang   +6 more
openaire   +3 more sources

Middle Interlayer Engineered Ferroelectric NAND Flash Overcoming Reliability and Stability Bottlenecks for Next‐Generation High‐Density Storage Systems [PDF]

open access: yesAdvanced Science
Multilevel storage and low‐voltage operation position ferroelectric transistors as promising candidates for next‐generation nonvolatile memory. Among them, gate‐injection‐type ferroelectric transistors offer improved vertical scalability and power ...
Giuk Kim   +12 more
doaj   +2 more sources

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