Results 41 to 50 of about 9,708,358 (219)

Low-voltage solution-processed Cuprous thiocyanate Thin-Film transistors with NAND logic function

open access: yesResults in Physics, 2023
Coprous thiocyanate (CuSCN)-based thin-film transistors (TFTs) by solution-processed chitosan electrolyte are fabricated on glass substrates. Such TFTs show a low operation voltage of −2.0 V due to the large specific gate capacitance of 7.65 μF/cm2 ...
Liuhui Lei   +7 more
doaj   +1 more source

Modello del DCP nelle memorie 3D NAND Flash [PDF]

open access: yes, 2022
LAUREA MAGISTRALELa crescente volontà di aumentare la densità di dati immagazzinabili, in dispositivi di dimensioni sempre più ridotte e più economici da fabbricare, ha condotto la ricerca verso la miniaturizzazione delle memorie NAND.
MONCELLI, VITO FRANCESCO
core  

800 MB/s DDR NAND Flash Memory Multi-Chip Package With Source-Synchronous Interface for Point-to-Point Ring Topology

open access: yesIEEE Access, 2013
A 256 Gb NAND flash memory multi-chip package (MCP) includes eight stacked 32 Gb 2 bit/cell multi-level cell (MLC) die and an 11.6 mm2 HyperLink NAND bridge chip providing four internal NAND channels for concurrent memory operations.
Peter Gillingham   +7 more
doaj   +1 more source

Behavioral modeling for low-voltage pentacene-based OTFTs and their implementations for organic logic circuits

open access: yesEngineering Science and Technology, an International Journal, 2023
We present a behavioral compact model and its implementation for low-voltage pentacene-based organic thin film transistors (OTFTs) using industry standard BSIM4 (Berkeley Short-channel IGFET Model) in LTspice platform.
Nihat Akkan, Mustafa Altun, Herman Sedef
doaj   +1 more source

Secondary Particles Generated by Protons in 3D NAND Flash Memories

open access: yes, 2022
We studied the secondary byproducts created by high-energy protons inside an SEU detector based on 3D NAND Flash memories, extending the previously developed methodology used for detecting heavy ions.
Gerardin S.   +8 more
core   +1 more source

Effects of Poly-Si Grain Boundary on Retention Characteristics under Cross-Temperature Conditions in 3-D NAND Flash Memory

open access: yesMicromachines, 2023
Electrical characteristics with various program temperatures (TPGM) in three-dimensional (3-D) NAND flash memory are investigated. The cross-temperature conditions of the TPGM up to 120 °C and the read temperature (TREAD) at 30 °C are used to analyze the
Ukju An   +6 more
doaj   +1 more source

NAND Flash Memory Organization and Operations

open access: yes, 2015
NAND flash memories are well known for their uncomplicated structure, low cost, and high capacity. Their typical characteristics include architecture, sequential reading, and high density.
Kuchta, Radek   +2 more
core   +1 more source

Achieving High ON State Current through Ferroelectric Polarization‐Dependent Interfacial Resistance Switching in Undoped Orthorhombic HfO2 Films

open access: yesAdvanced Functional Materials, EarlyView.
Ferroelectric tunnel junction devices based on epitaxial undoped ferroelectric HfO2 films demonstrate stable switching endurance of over 106 switching cycles, low write voltages of ±3 V, 16 measured resistance states, and neuromorphic capability.
Markus Hellenbrand   +13 more
wiley   +1 more source

Monolithic Oxidation Enables Ultrathin Vertically Graded Tantalum Oxide for Low‐Voltage, Low‐Variability Memristive Switching

open access: yesAdvanced Functional Materials, EarlyView.
Monolithic UV‐ozone oxidation of Ta forms an ultrathin Ta2O5/TaOx bilayer enabling resistive switching with a vertical defect gradient. A stoichiometric surface layer over an oxygen‐deficient sublayer promotes localized filament nucleation near the top interface, enabling low‐voltage operation, and reduced cycle‐to‐cycle variability.
Seunghoon Yang   +11 more
wiley   +1 more source

Dielectric Engineering to Suppress Cell-to-Cell Programming Voltage Interference in 3D NAND Flash Memory

open access: yesMicromachines, 2021
In contrast to conventional 2-dimensional (2D) NAND flash memory, in 3D NAND flash memory, cell-to-cell interference stemming from parasitic capacitance between the word-lines (WLs) is difficult to control because the number of WLs, achieved for better ...
Woo-Jin Jung, Jun-Young Park
doaj   +1 more source

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