1836 V, 4.7 mΩ•cm<sup>2</sup> High Power 4H-SiC Bipolar Junction Transistor
Jian Hui Zhang +5 more
openalex +1 more source
Step edge influence on barrier height and contact area in vertical heterojunctions between epitaxial graphene and n-type 4H-SiC [PDF]
Marko J. Tadjer +10 more
openalex +1 more source
Formation of luminescent defects in 4H-SiC upon ion irradiation and ns laser annealing. [PDF]
Zanelli G +15 more
europepmc +1 more source
Atomic-Scale Revelation of Voltage-Modulated Electrochemical Corrosion Mechanism in 4H-SiC Substrate. [PDF]
Luo Q +7 more
europepmc +1 more source
Deep-Ultraviolet Laser-Based Defect Inspection of Single-Crystal 4H-SiC and SmartSiC<sup>TM</sup> Engineered Substrates for High Volume Manufacturing [PDF]
Enrica Cela +5 more
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Polarity Effect on the Heteroepitaxial Growth of B<sub>x</sub>C on 4H-SiC by CVD [PDF]
François Cauwet +4 more
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The Gate Oxide Breakdown Failures of 4H-SiC MOS Devices
Cai Ping Wan +3 more
openalex +1 more source
Laser-Induced Liquid-Phase Boron Doping of 4H-SiC. [PDF]
Kulkarni G +4 more
europepmc +1 more source
Electrochemical etching strategy for shaping monolithic 3D structures from 4H-SiC wafers. [PDF]
Hochreiter A +4 more
europepmc +1 more source

