Results 11 to 20 of about 702 (151)

Characterization of Al2O3/4H-SiC and Al2O3/SiO2/4H-SiC MOS structures [PDF]

open access: yesBulletin of the Polish Academy of Sciences Technical Sciences, 2016
Abstract The paper presents the results of characterization of MOS structures with aluminum oxide layer deposited by ALD method on silicon carbide substrates. The effect of the application of thin SiO2 buffer layer on the electrical properties of the MOS structures with Al2O3 layer has been examined. Critical electric field values at the level of 7.5–8
A. Taube   +7 more
openaire   +1 more source

Combination of Plasma Electrolytic Processing and Mechanical Polishing for Single-Crystal 4H-SiC

open access: yesMicromachines, 2021
Single-crystal 4H-SiC is a typical third-generation semiconductor power-device material because of its excellent electronic and thermal properties. A novel polishing technique that combines plasma electrolytic processing and mechanical polishing (PEP-MP)
Gaoling Ma   +5 more
doaj   +1 more source

Thermal Conductivity of 3C/4H-SiC Nanowires by Molecular Dynamics Simulation

open access: yesNanomaterials, 2023
Silicon carbide (SiC) is a promising material for thermoelectric power generation. The characterization of thermal transport properties is essential to understanding their applications in thermoelectric devices.
Kaili Yin   +5 more
doaj   +1 more source

Modified divacancies in 4H-SiC

open access: yesJournal of Applied Physics, 2022
Divacancies near or at lattice defects in SiC, the PL5–PL7 photoluminescence centers, are known to have more favorable optical and spin properties for applications in quantum technology compared to the usual divacancies. These centers were previously predicted to be divacancies near stacking faults. Using electron paramagnetic resonance, we observe PL5,
N. T. Son   +3 more
openaire   +1 more source

Thermal Behaviors and Optical Parametric Oscillation in 4H‐Silicon Carbide Integrated Platforms

open access: yesAdvanced Photonics Research, 2021
4H‐silicon carbide (SiC) integrated platforms have shown great potential in quantum and nonlinear photonics. However, the thermal properties of 4H‐SiC waveguides are still unknown, even though thermo‐optic effects can play an important role in ...
Xiaodong Shi   +7 more
doaj   +1 more source

Timing Performance Simulation for 3D 4H-SiC Detector

open access: yesMicromachines, 2021
To meet the high radiation challenge for detectors in future high-energy physics, a novel 3D 4H-SiC detector was investigated. Three-dimensional 4H-SiC detectors could potentially operate in a harsh radiation and room-temperature environment because of ...
Yuhang Tan   +16 more
doaj   +1 more source

Relationship between electrical properties and interface structures of SiO2/4H-SiC prepared by dry and wet oxidation

open access: yesAIP Advances, 2019
We have investigated the relationship between the electrical properties and interfacial atomic structure of SiO2/4H-SiC interfaces, prepared by dry and wet thermal oxidation procedures with 4H-SiC (0001) and 4H-SiC (000-1) substrates, using extended x ...
Efi Dwi Indari   +4 more
doaj   +1 more source

High Single-Event Burnout Resistance 4H-SiC Junction Barrier Schottky Diode

open access: yesIEEE Journal of the Electron Devices Society, 2021
This paper presents a single-event burnout (SEB) resistance method for 4H-SiC Junction Barrier Schottky Diode (JBS) under high bias voltage and linear energy transfer (LET) conditions.
Mao-Bin Li   +5 more
doaj   +1 more source

Influences of Nonaqueous Slurry Components on Polishing 4H-SiC Substrate with a Fixed Abrasive Pad

open access: yesCrystals, 2023
4H-SiC wafers are more likely to sustain a lower material removal rate (MRR) and severe subsurface damage in conventional chemical mechanical polishing (CMP) methods.
Jiyuan Zhong   +6 more
doaj   +1 more source

Effect of hexagonality on the pressure-dependent lattice dynamics of 4H-SiC

open access: yesNew Journal of Physics, 2022
The pressure-dependent lattice dynamics of 4H-SiC is investigated using diamond anvil cell, and compared with those of 3C- and 6H-SiC. It is found that both the zone-center longitudinal optical (LO) and transverse optical (TO) modes shift to higher ...
Junran Zhang   +9 more
doaj   +1 more source

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