Results 61 to 70 of about 240,009 (234)

Highly sensitive 4H-SiC pressure sensor at cryogenic and elevated temperatures [PDF]

open access: yes, 2018
The slow etching rate of conventional micro-machining processes is hindering the use of bulk silicon carbide materials in pressure sensing. This paper presents a 4H-SiC piezoresistive pressure sensor utilising a laser scribing approach for fast ...
Nguyen, Nam-Trung   +7 more
core   +1 more source

Thermal Stability of Gate Driver Circuits Based on 4H-SiC MOSFETs at 300°C for High-Power Applications

open access: yesIEEE Journal of the Electron Devices Society
The operation and reliability of gate driver circuits based on 4H-SiC MOSFETs at temperatures up to 300°C were reported. Due to the advantages of 4H-SiC MOSFETs, the driver circuit can overcome limitations in complicated circuit design and power ...
Vuong Van Cuong   +5 more
doaj   +1 more source

Roadmap for SiC power devices

open access: yesJournal of Telecommunications and Information Technology, 2000
Silicon carbide (SiC) power devices offer significant benefits of improved efficiency, dynamic performance and reliability of electronic and electric systems.
Mietek Bakowski
doaj   +1 more source

Electronic Structure and High Magnetic Properties of (Cr, Co)-codoped 4H–SiC Studied by First-Principle Calculations

open access: yesCrystals, 2020
The electronic structure and magnetic properties of 3d transition metal (Cr, Co)-codoped 4H–SiC were studied by density functional theory within GGA methods.
Mengyu Zhang   +4 more
doaj   +1 more source

Electrical Properties and Interfacial Strain in Thermally Oxidized 4H‐SiC MOS Structures Under Different Post‐Oxidation Annealing

open access: yesAdvanced Electronic Materials, EarlyView.
This work investigates the electrical properties and interfacial strain in thermally oxidized 4H‐SiC MOS structures under different post‐oxidation annealing. Nitrogen annealing simultaneously reduces interface state density and increases interfacial tensile strain, thus being accompanied by the formation of an interfacial dipole.
Fabrizio Roccaforte   +9 more
wiley   +1 more source

Characterization of Nitrogen-Boron doped 4H-SiC substrates

open access: yesInternational Journal of Electrochemical Science, 2013
Nitrogen-Boron doped 4H-SiC single crystal was prepared by physical vapor transport method and the doping concentration was determined by secondary ion mass spectroscopy. The resistivity of 4H-SiC substrate was measured by contactless method.
Rusheng Wei   +7 more
doaj   +1 more source

Revealing Hidden Raman Signatures Through Attention‐Based Spectral Unmixing

open access: yesAdvanced Intelligent Systems, EarlyView.
Weak Raman signatures are recovered from background‐dominated spectra using a transformer‐based, reference‐free spectral unmixing AI framework. Self‐attention reconstructs substrate contribution directly from mixed data, enabling reliable extraction of previously inaccessible vibrational features.
Dmitriy A. Poteryayev   +9 more
wiley   +1 more source

Anisotropic hole drift velocity in 4H-SiC [PDF]

open access: yesMaterials Science and Engineering: B, 2019
A theoretical study on the nonlinear transport of holes in the transient and steady state of p-doped 4H-SiC under the influence of high electric fields is presented. It is based on a nonlinear quantum kinetic theory which provides a clear description of the dissipative phenomena that are evolving in the system.
Vasconcelos, Jackelinne L.   +2 more
openaire   +2 more sources

Multidimensional Engineering Enabling Rate‐Matched C−N Coupling for Efficient Organonitrogen Electrosynthesis

open access: yesEcoEnergy, EarlyView.
This review introduces rate matching as a unifying design principle for efficient electrochemical C−N coupling and highlights multidimensional engineering of catalysts, interfaces, and reactors to synchronize the generation of carbon‐ and nitrogen‐containing intermediates, balance their surface coverages, maximize C−N bond formation, and enable ...
Kaixing Cai   +4 more
wiley   +1 more source

Experimental Investigation of Piezoresistive Effect in p-type 4H-SiC

open access: yes, 2017
This letter presents for the first time the piezoresistive effect in p-type 4H-SiC. Longitudinal and transverse p-type 4H-SiC piezoresistors with a doping concentration of 1018cm3 were fabricated along [1100] directions.
Nguyen, Nam-Trung   +23 more
core   +1 more source

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