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Degradation of 4H-SiC MOSFET body diode under repetitive surge current stress
2020Zhengyun Zhu, Na Ren, Hongyi Xu
exaly
Experimental studies on robustness of super junction VDMOS during the body diode reverse recovery
2016Zehong Li, Bo Zhang
exaly
[Conduction of electric current in fixed bodies: semiconductor diodes and transistors].
Elektro Medizin; Biomedizin und Technik, 1966openaire +1 more source

