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Optical and EUV projection lithography: A computational view
S.21-34This article reviews modeling approaches for optical and extreme ultraviolet (EUV) projection lithography. It explains the models for the rigorous computation of light diffraction from lithographic masks, a vector formulation of image formation in
Evanschitzky, P. +6 more
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Optical losses in photovoltaic (PV) systems cause nonradiative recombination or incomplete absorption of incident light, hindering the attainment of high energy conversion efficiency.
Young Min Song (7401251) +7 more
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The non-ideal mask absorber can cause an increase in critical dimension error (CDE) and decrease in process window (PW). However, the random mask absorber errors induced during mask fabricating and measuring are not considered in computational ...
Naiyuan Sheng +6 more
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Modeling of grayscale lithography and calibration with experimental data for blazed gratings
Paper 118750K, 14 S.This paper discusses a collaborative effort of two Fraunhofer institutes to develop a lithography model that simulates the fabrication of blazed gratings using grayscale lithography.
Leitel, R., Erdmann, A., Bhardwaj, P.
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Although conventional computer technology made a huge leap forward in the past decade, a vast number of computational problems remain inaccessible due to their inherently complex nature.
Lindberg, F. +33 more
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Multi-Objective Defocus Robust Source and Mask Optimization Using Sensitive Penalty
The continuous decrease in the size of lithographic technology nodes has led to the development of source and mask optimization (SMO) and also to the control of defocus becoming stringent in the actual lithography process.
Pengzhi Wei +5 more
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3D Mask Simulation and Lithographic Imaging using Physics-Informed Neural Networks
The increasing demands on computational lithography and imaging in the design and optimization of lithography processes necessitate rigorous modeling of EUV light diffracted from the mask.
Erdmann, Andreas +2 more
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As the lithography process continues to become more rigorous in advanced technology nodes, the model-based optical proximity correction (MBOPC), as a core component within computational lithography, necessitates the development of highly precise ...
Jinhao Zhu +6 more
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Mass production-enabled computational spectrometers based on multilayer thin films
Multilayer thin film (MTF) filter arrays for computational spectroscopy are fabricated using stencil lithography. The MTF filter array is a 6 × 6 square grid, and 169 identical arrays are fabricated on a single wafer.
Cheolsun Kim +3 more
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Guest Editorial: Computational Lithography [PDF]
This PDF file contains the editorial “Guest Editorial: Computational Lithography” for JM3 Vol.
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