Results 31 to 40 of about 7,747 (289)

Optical and EUV projection lithography: A computational view

open access: yes, 2022
S.21-34This article reviews modeling approaches for optical and extreme ultraviolet (EUV) projection lithography. It explains the models for the rigorous computation of light diffraction from lithographic masks, a vector formulation of image formation in
Evanschitzky, P.   +6 more
core   +1 more source

Lithography-Free, Large-Area Spatially Segmented Disordered Structure for Light Harvesting in Photovoltaic Modules

open access: yes, 2022
Optical losses in photovoltaic (PV) systems cause nonradiative recombination or incomplete absorption of incident light, hindering the attainment of high energy conversion efficiency.
Young Min Song (7401251)   +7 more
core   +1 more source

Mitigating the Impact of Mask Absorber Error on Lithographic Performance by Lithography System Holistic Optimization

open access: yesApplied Sciences, 2019
The non-ideal mask absorber can cause an increase in critical dimension error (CDE) and decrease in process window (PW). However, the random mask absorber errors induced during mask fabricating and measuring are not considered in computational ...
Naiyuan Sheng   +6 more
doaj   +1 more source

Modeling of grayscale lithography and calibration with experimental data for blazed gratings

open access: yes, 2022
Paper 118750K, 14 S.This paper discusses a collaborative effort of two Fraunhofer institutes to develop a lithography model that simulates the fabrication of blazed gratings using grayscale lithography.
Leitel, R., Erdmann, A., Bhardwaj, P.
core   +1 more source

Approach to combine electron-beam lithography and two-photon polymerization for enhanced nano-channels in network-based biocomputation devices

open access: yes, 2018
Although conventional computer technology made a huge leap forward in the past decade, a vast number of computational problems remain inaccessible due to their inherently complex nature.
Lindberg, F.   +33 more
core   +2 more sources

Multi-Objective Defocus Robust Source and Mask Optimization Using Sensitive Penalty

open access: yesApplied Sciences, 2019
The continuous decrease in the size of lithographic technology nodes has led to the development of source and mask optimization (SMO) and also to the control of defocus becoming stringent in the actual lithography process.
Pengzhi Wei   +5 more
doaj   +1 more source

3D Mask Simulation and Lithographic Imaging using Physics-Informed Neural Networks

open access: yes, 2023
The increasing demands on computational lithography and imaging in the design and optimization of lithography processes necessitate rigorous modeling of EUV light diffracted from the mask.
Erdmann, Andreas   +2 more
core   +1 more source

Machine Learning-Enhanced Model-Based Optical Proximity Correction by Using Convolutional Neural Network-Based Variable Threshold Method

open access: yesIEEE Access
As the lithography process continues to become more rigorous in advanced technology nodes, the model-based optical proximity correction (MBOPC), as a core component within computational lithography, necessitates the development of highly precise ...
Jinhao Zhu   +6 more
doaj   +1 more source

Mass production-enabled computational spectrometers based on multilayer thin films

open access: yesScientific Reports, 2022
Multilayer thin film (MTF) filter arrays for computational spectroscopy are fabricated using stencil lithography. The MTF filter array is a 6 × 6 square grid, and 169 identical arrays are fabricated on a single wafer.
Cheolsun Kim   +3 more
doaj   +1 more source

Guest Editorial: Computational Lithography [PDF]

open access: yesJournal of Micro/Nanolithography, MEMS, and MOEMS, 2009
This PDF file contains the editorial “Guest Editorial: Computational Lithography” for JM3 Vol.
openaire   +1 more source

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