Results 11 to 20 of about 6,733 (201)

Electragel for Advanced Static Charge Mitigation and Energy Harvesting. [PDF]

Adv Sci (Weinh)
Electragel is a transformative material that scavenges static charges for simultaneous dissipation and electricity generation, enabling dual‐purpose static control and energy harvesting across industries while shifting paradigms from mitigation to sustainable utilization of electrostatic energy. Abstract The heightened sensitivity of modern electronics
Firdous I, Fahim M, Lin K, Ho TC, Zhu Y, Tso CY.   +5 more
europepmc   +2 more sources

Electrostatic Defrosting. [PDF]

Small Methods
Electrostatic defrosting is pioneered by suspending a high voltage electrode plate over a sheet of frost. As pictured here, electrostatic defrosting was able to remove three quarters of a frost sheet from a superhydrophobic glass substrate. Abstract Electrification of ice has been studied for over half a century, mostly in the context of atmospheric ...
Lolla VY, Zhang H, Socha BZ, Qiao R, Boreyko JB.   +4 more
europepmc   +2 more sources

Optimization of Tunnel Field-Effect Transistor-Based ESD Protection Network

Crystals, 2021
The tunnel field-effect transistor (TFET) is a potential candidate for replacing the reverse diode and providing a secondary path in a whole-chip electrostatic discharge (ESD) protection network.
Zhihua Zhu, Zhaonian Yang, Xiaomei Fan, Yingtao Zhang, Juin Jei Liou, Wenbing Fan   +5 more
doaj   +1 more source

Non-Pad-Based in Situ In-Operando CDM ESD Protection Using Internally Distributed Network

IEEE Journal of the Electron Devices Society, 2021
Charged device model (CDM) electrostatic discharge (ESD) protection is an emerging design challenge to ICs at advanced technology nodes. It was recently reported that the traditional pad-based CDM ESD protection methods are fundamentally faulty, which ...
Mengfu Di, Cheng Li, Zijin Pan, Albert Wang   +3 more
doaj   +1 more source

3D TCAD Analysis Enabling ESD Layout Design Optimization

IEEE Journal of the Electron Devices Society, 2020
On-chip electrostatic discharge (ESD) protection design for integrated circuits (ICs) is a challenging design-for-reliability problem. Since ESD events involve very high current transients in very short time period, current crowding is unavoidable, which
Zijin Pan, Cheng Li, Mengfu Di, Feilong Zhang, Albert Wang   +4 more
doaj   +1 more source

Turn-on speed of grounded gate NMOS ESD protection transistors [PDF]

, 1996
The turn-on speed of nMOS transistors (nMOST) is of paramount importance for robust Charged Device Model (CDM) protection circuitry. In this paper the nMOST turn-on time has been measured for the first time in the sub-halve nanosecond range with a ...
Kuper, F.G., Luchies, J.R.M., Meneghesso, G., Mouthaan, A.J.   +3 more
core   +7 more sources

ESD Design Verification Aided by Mixed-Mode Multiple-Stimuli ESD Simulation

IEEE Journal of the Electron Devices Society, 2021
Electrostatic discharge (ESD) protection is a grand design challenge for complex ICs in advanced technologies. ESD simulation is indispensable to guide ESD protection designs.
Mengfu Di, Zijin Pan, Cheng Li, Albert Wang   +3 more
doaj   +1 more source

Investigation of the effect of polyaniline additive on reducing static charge accumulation in HMX and PETN explosives [PDF]

شیمی کاربردی روز, 2022
One of the main causes of explosions events in high energetic material industry is static electricity. Handling of energetic materials leads to the generation of electrostatic charges. Most energetic materials are non-conductive, easily accumulate charge
Manoochehr Fathollahi, Habibeh Lotfzadeh, Fatemeh Hemmati Khorasanloo,, Seyed Ghorban Hosseini, Manouchehr Fathollahi   +4 more
doaj   +1 more source

Design of an Apparatus for Experimental Validation of the Plasma Kinetic Model for Electrostatic Discharge [PDF]

, 2018
Electrostatic discharge (ESD) events are a serious safety concern when handling nuclear weapons. Current safety analysis operates under the assumption that sparks produced during threshold ESD events are overdriven and deliver all stored energy to a ...
Webb, Matthew D.
core   +1 more source

Electrostatic Discharge (ESD) and Electrical Overstress (EOS): The state of the art in components to systems

Engineering and Applied Science Research, 2017
Electrostatic Discharge (ESD), Electrical Overstress (EOS) and electromagnetic compatibility (EMC) continue to impact semiconductor manufacturing, semiconductor components and systems as technologies scale from micro- to nano-electronics.
Steven H. Voldman
doaj   +1 more source