Results 21 to 30 of about 6,733 (201)
Pad-Based CDM ESD Protection Methods Are Faulty
IEEE Journal of the Electron Devices Society, 2020 Charged device model (CDM) electrostatic discharge (ESD) protection remains a huge challenge for integrated circuit (IC) reliability designs. The “internal-oriented” CDM model and the “external-oriented” human body model (HBM)
Mengfu Di +3 more
doaj +1 more source
Effect of ESD on complex programmable logic device and field programmable gate arrays [PDF]
, 2013 Complex electronics devices are becoming more sensitive to electrostatic discharge (ESD). These components are being developed with higher density (extra memory bits per unit volume) and are becoming faster (MHz, GHz, THz, etc.).
Pande, D.C. +2 more
core +1 more source
IEEE Journal of the Electron Devices Society, 2023 The power-rail electrostatic discharge (ESD) clamp circuits have been widely used in CMOS integrated circuits (ICs) to provide effective discharging paths for on-chip ESD protection design. Among all ESD events, the most serious threat is posed to ICs by
Yi-Chun Huang, Ming-Dou Ker
doaj +1 more source
Mathematical method for air electrostatic discharge circuits calculation
High Voltage, 2018 Here, a new analytical method, state matrix transform method, is proposed for calculating the descriptions of current waveforms generated by commercial electrostatic discharge (ESD) generators.
Liu Xinggang, Wei Ming, Hu Xiaofeng
doaj +1 more source
A 5.3mW, 2.4GHz ESD protected Low-Noise Amplifier in a 0.13μm RFCMOS technology [PDF]
, 2007 An Electrostatic Discharge (ESD) protected Low- Noise Amplifier (LNA) for the 2.4 GHz ISM band designed in a 0.13 mum standard RFCMOS technology is presented. The amplifier, including packaging effects, achieves 16.8 dB power gain, reflexion coefficients
Brandano, Davide +3 more
core +1 more source
A Study of Transient Voltage Peaking in Diode-Based ESD Protection Structures in 28nm CMOS
IEEE Access, 2020 Transient voltage peaking under very fast electrostatic discharge (ESD), like charged device model (CDM) pulse, is a serious problem to integrated circuits (ICs).
Chenkun Wang +5 more
doaj +1 more source
IEEE Access, 2023 The modern electronic device should be able to provide stable voltage and current under a variety of conditions. The LDO regulator used in the electronic device is a system that requires various voltages and load currents.
Sang-Wook Kwon, Yong-Seo Koo
doaj +1 more source
IEEE Access, 2018 An electrostatic discharge (ESD) event can cause a medical device to fail and pose a threat to patients'safety. This paper presents the data mining analysis of ESD failures in medical devices, over the last ten years, using the U.S.
Mehdi Kohani, Michael Pecht
doaj +1 more source
AIP Advances, 2023 The NiCr igniter is a key element of MEMS-based electro-explosive device (mEED), while electrostatic discharge (ESD) may excite the igniter accidentally. To protect the NiCr igniter from damage by ESD, a novel NiCr igniter by integrating the igniter onto
Wei Liu +7 more
doaj +1 more source
A compact broadband ESD protection circuit using multi‐layer helical inductor
Electronics Letters, 2021 Here, a broadband electrostatic discharge (ESD) protection circuit using area‐efficient multi‐layer helical inductors is presented. The proposed concept was verified in a 0.18 μm 1P6M CMOS process, and the circuit area is only 54 × 63 μm2.
Wang‐Hui Zou, Peng Tang, Zhi‐Hua Zhu
doaj +1 more source